Inventor
MIYAGAWA HIROMITSU
JP4 patents
Patents
4 patentsUS9077927B2Jul 7, 2015
Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defect
MIYAGAWA HIROMITSU4 citations67
US9313341B2Apr 12, 2016
Image test apparatus and system for calculating a stack position of a sheet including a defective image
MIYAGAWA HIROMITSU3 citations66
US11470207B2Oct 11, 2022
Image processing apparatus, image processing system, image processing method, and non-transitory computer-readable storage medium
MIYAGAWA HIROMITSU0 citations57
US9727807B2Aug 8, 2017
Image processing system, image generation-output control apparatus, and method of processing information, configured to use imposition conversion
MIYAGAWA HIROMITSU0 citations32