Inventor
YAGUCHI TOSHIE
JP19 patents
⚠️ This page may combine multiple inventors who share the name “YAGUCHI TOSHIE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
11 patentsUS7612337B2Nov 3, 2009
Focused ion beam system and a method of sample preparation and observation
HITACHI HIGH TECH CORP30 citations91
US7863564B2Jan 4, 2011
Electric charged particle beam microscope and microscopy
HITACHI HIGH TECH CORP13 citations82
US7622714B2Nov 24, 2009
Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus
HITACHI HIGH TECH CORP6 citations73
US10068745B2Sep 4, 2018
Charged particle beam device and sample holder for charged particle beam device
HITACHI HIGH TECH CORP3 citations72
US11177109B2Nov 16, 2021
Specimen holder and charged particle beam device provided with same
HITACHI HIGH TECH CORP0 citations62
US12183542B2Dec 31, 2024
Transmission electron microscope and imaging method
HITACHI HIGH TECH CORP0 citations58
US10636621B2Apr 28, 2020
Charged particle beam device for moving an aperture having plurality of openings and sample observation method
HITACHI HIGH TECH CORP1 citations58
US10535497B2Jan 14, 2020
Electron microscope and imaging method
HITACHI HIGH TECH CORP0 citations51
US9378922B2Jun 28, 2016
Electron microscope and electron microscope sample retaining device
HITACHI HIGH TECH CORP0 citations51
US12170184B2Dec 17, 2024
Transmission electron microscope and inspection method using transmission electron microscope
HITACHI HIGH TECH CORP0 citations43
US9754762B2Sep 5, 2017
Electron microscope and sample observation method
HITACHI HIGH TECH CORP0 citations40
YAGUCHI TOSHIE
4 patentsUS8878144B2Nov 4, 2014
Electron microscope and sample holder
YAGUCHI TOSHIE9 citations81
US8835847B2Sep 16, 2014
Sample holding apparatus for electron microscope, and electron microscope apparatus
YAGUCHI TOSHIE8 citations81
US8604429B2Dec 10, 2013
Electron beam device and sample holding device for electron beam device
YAGUCHI TOSHIE7 citations81
US9099281B2Aug 4, 2015
Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus
YAGUCHI TOSHIE1 citations49