Inventor
KRUUS ERIK
US17 patents
⚠️ This page may combine multiple inventors who share the name “KRUUS ERIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC LAB AMERICA INC
14 patentsUS9984337B2May 29, 2018
Parallelized machine learning with distributed lockless training
NEC LAB AMERICA INC22 citations94
US7844581B2Nov 30, 2010
Methods and systems for data management using multiple selection criteria
NEC LAB AMERICA INC24 citations91
US9471500B2Oct 18, 2016
Bucketized multi-index low-memory data structures
NEC LAB AMERICA INC14 citations80
US10402235B2Sep 3, 2019
Fine-grain synchronization in data-parallel jobs for distributed machine learning
NEC LAB AMERICA INC3 citations72
US9531403B2Dec 27, 2016
Adaptive compression supporting output size thresholds
NEC LAB AMERICA INC3 citations72
US12592063B2Mar 31, 2026
Machine learning of spatio-temporal manifolds for source-free video domain adaptation
NEC LAB AMERICA INC0 citations60
US11356334B2Jun 7, 2022
Communication efficient sparse-reduce in distributed machine learning
NEC LAB AMERICA INC0 citations51
US11354935B2Jun 7, 2022
Object recognizer emulation
NEC LAB AMERICA INC0 citations51
US11086814B2Aug 10, 2021
System and method for communication efficient sparse-reduce
NEC LAB AMERICA INC0 citations51
US10291485B2May 14, 2019
System and method for fault-tolerant parallel learning over non-iid data
NEC LAB AMERICA INC0 citations51
US12567231B2Mar 3, 2026
Weakly supervised action localization
NEC LAB AMERICA INC0 citations50
US12462895B2Nov 4, 2025
T-cell receptor repertoire selection prediction with physical model augmented pseudo-labeling for personalized medicine decision making
NEC LAB AMERICA INC0 citations47
US10740212B2Aug 11, 2020
Content-level anomaly detector for systems with limited memory
NEC LAB AMERICA INC0 citations41
US10402234B2Sep 3, 2019
Fine-grain synchronization in data-parallel jobs
NEC LAB AMERICA INC0 citations41