Inventor
KURIHARA MASAKI
JP69 patents
⚠️ This page may combine multiple inventors who share the name “KURIHARA MASAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CANON KK
12 patentsUS7945873B2May 17, 2011
Mask pattern data generating method, information processing apparatus, photomask fabrication system, and image sensing apparatus
CANON KK6 citations74
US9412785B2Aug 9, 2016
Method of manufacturing semiconductor apparatus
CANON KK3 citations73
US9305965B2Apr 5, 2016
Solid-state imaging apparatus and method of manufacturing the same
CANON KK5 citations72
US9236413B2Jan 12, 2016
Manufacturing method of solid-state imaging apparatus
CANON KK3 citations72
US9837463B2Dec 5, 2017
Solid-state imaging device and method of manufacturing the same
CANON KK2 citations70
US11211416B2Dec 28, 2021
Photoelectric conversion apparatus having light shielding portions above semiconductor layer on back surface side and equipment
CANON KK1 citations63
US10497733B2Dec 3, 2019
Photoelectric conversion apparatus and system
CANON KK1 citations63
US10497732B2Dec 3, 2019
Photoelectric conversion apparatus and camera
CANON KK1 citations63
US11751417B2Sep 5, 2023
Organic device and method of manufacturing the same
CANON KK0 citations62
US11322555B2May 3, 2022
Light-emitting device, display apparatus, and image pickup apparatus
CANON KK0 citations62
US11018316B2May 25, 2021
Organic device and method of manufacturing the same
CANON KK1 citations62
US10896934B2Jan 19, 2021
Light-emitting device, display apparatus, and image pickup apparatus
CANON KK0 citations62
EPSON CORP
5 patentsUSD291442SAug 18, 1987
Computer
EPSON CORP69 citations96
USD282843SMar 4, 1986
Portable electronic computer
EPSON CORP48 citations96
USD279728SJul 23, 1985
Carrying case
EPSON CORP17 citations82
USD284869SJul 29, 1986
Electronic calculator
EPSON CORP7 citations74
USD281426SNov 19, 1985
Keyboard for an electronic computer
EPSON CORP10 citations74
FANUC LTD
5 patentsUS6278075B1Aug 21, 2001
Controller of wire electric discharge machine
FANUC LTD35 citations92
US6130510AOct 10, 2000
Electric discharge machining power source unit for electric discharge machine
FANUC LTD21 citations92
US7039490B2May 2, 2006
Controller for wire electric discharge machine
FANUC LTD9 citations74
US7019246B2Mar 28, 2006
Controller for wire electric discharge machine
FANUC LTD8 citations74
US6980879B2Dec 27, 2005
Controller for wire electric discharge machine
FANUC LTD9 citations74
HITACHI HIGH TECH CORP
4 patentsUS7991217B2Aug 2, 2011
Defect classifier using classification recipe based on connection between rule-based and example-based classifiers
HITACHI HIGH TECH CORP15 citations93
US7598490B2Oct 6, 2009
SEM-type reviewing apparatus and a method for reviewing defects using the same
HITACHI HIGH TECH CORP29 citations93
US7873202B2Jan 18, 2011
Method and apparatus for reviewing defects of semiconductor device
HITACHI HIGH TECH CORP12 citations84
US6794665B2Sep 21, 2004
Electron beam drawing apparatus
HITACHI HIGH TECH CORP2 citations62
TOKYO OHKA KOGYO CO LTD
4 patentsUS7358028B2Apr 15, 2008
Chemically amplified positive photo resist composition and method for forming resist pattern
TOKYO OHKA KOGYO CO LTD10 citations83
US6296992B1Oct 2, 2001
Positive photoresist composition and process for forming contact hole
TOKYO OHKA KOGYO CO LTD6 citations74
US6177226B1Jan 23, 2001
Positive photoresist composition and process for forming contact hole
TOKYO OHKA KOGYO CO LTD7 citations74
US6207340B1Mar 27, 2001
Positive photoresist composition and process for forming contact hole
TOKYO OHKA KOGYO CO LTD4 citations63
HITACHI LTD
3 patentsKURIHARA MASAKI
3 patentsUS8786739B2Jul 22, 2014
Photoelectric conversion device and imaging system
KURIHARA MASAKI7 citations83
US8581976B2Nov 12, 2013
Method and apparatus for reviewing defects of semiconductor device
KURIHARA MASAKI7 citations83
US8995773B2Mar 31, 2015
Image measurement apparatus and method of measuring works using edge detection tools
KURIHARA MASAKI3 citations62
MITUTOYO CORP
3 patentsUS10282837B2May 7, 2019
Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded
MITUTOYO CORP2 citations73
US9341460B2May 17, 2016
Double cone stylus, touch probe, and method of calibrating double cone stylus
MITUTOYO CORP4 citations72
US7515764B2Apr 7, 2009
Image processing apparatus using morphology
MITUTOYO CORP3 citations62
NAKAGAKI RYO
2 patentsUS8452076B2May 28, 2013
Defect classifier using classification recipe based on connection between rule-based and example-based classifiers
NAKAGAKI RYO20 citations92
US8150141B2Apr 3, 2012
Defect classifier using classification recipe based on connection between rule-based and example-based classifiers
NAKAGAKI RYO10 citations84
SEIKO EPSON CORP
2 patentsCLARION CO LTD
1 patentINST TECH PRECISION ENG
1 patentNIPPON STEEL CHEMICAL CO
1 patentKOBAYASHI MASAHIRO
1 patentKK SUWA SEIKOSHA
1 patentHONDA MOTOR CO LTD
1 patentELECTRICAL DISCHARGE WORK S
1 patentShowing the top 50 of 69 patents by PatentIndex Score.