Inventor

KANG PO-ZENG

TW26 patents

⚠️ This page may combine multiple inventors who share the name “KANG PO-ZENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KANG PO-ZENG

TAIWAN SEMICONDUCTOR MFG CO LTD

Semiconductor device with source resistor and manufacturing method thereof

Device and method for temperature monitoring of a semiconductor device

Semiconductor device with source resistor and manufacturing method thereof

IC degradation management circuit, system and method

IC degradation management circuit, system and method

Output resistance testing method

Integrated circuit layout method

Power on control circuits and methods of operating the same

Temperature monitoring device and method

Semiconductor device with source resistor

Integrated circuit device, method, layout, and system

Device for temperature monitoring of a semiconductor device

Power on control circuits and methods of operating the same

Output resistance testing integrated circuit

Output resistance testing structure

Nearly buffer zone free layout methodology

High voltage guard ring semiconductor device and method of forming same

Uni-gate cell design

Time to current converter

Low gds measurement methodology for MOS

TAIWAN SEMICONDUCTOR MFG

FinFET with embedded MOS varactor and method of making same

FinFET with embedded MOS varactor and method of making same

Nearly buffer zone free layout methodology

Semiconductor device feature density gradient verification

PENG YOUNG-CHOW

Semiconductor device feature density gradient verification

CHEN CHUNG-HUI

Semiconductor mismatch reduction