Inventor
CHAN KELVIN
US99 patents
⚠️ This page may combine multiple inventors who share the name “CHAN KELVIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
34 patentsUS7297376B1Nov 20, 2007
Method to reduce gas-phase reactions in a PECVD process with silicon and organic precursors to deposit defect-free initial layers
APPLIED MATERIALS INC33 citations90
US10886172B2Jan 5, 2021
Methods for wordline separation in 3D-NAND devices
APPLIED MATERIALS INC8 citations84
US10622251B2Apr 14, 2020
Methods for wordline separation in 3D-NAND devices
APPLIED MATERIALS INC8 citations84
US10410869B2Sep 10, 2019
CVD based oxide-metal multi structure for 3D NAND memory devices
APPLIED MATERIALS INC8 citations84
US10354916B2Jul 16, 2019
Methods for wordline separation in 3D-NAND devices
APPLIED MATERIALS INC12 citations84
US9123532B2Sep 1, 2015
Low-k dielectric damage repair by vapor-phase chemical exposure
APPLIED MATERIALS INC5 citations84
US9105695B2Aug 11, 2015
Cobalt selectivity improvement in selective cobalt process sequence
APPLIED MATERIALS INC6 citations84
US7410916B2Aug 12, 2008
Method of improving initiation layer for low-k dielectric film by digital liquid flow meter
APPLIED MATERIALS INC9 citations84
US9508545B2Nov 29, 2016
Selectively lateral growth of silicon oxide thin film
APPLIED MATERIALS INC6 citations83
US11174551B2Nov 16, 2021
Methods for depositing tungsten on halosilane based metal silicide nucleation layers
APPLIED MATERIALS INC2 citations73
US9978685B2May 22, 2018
Conformal amorphous silicon as nucleation layer for W ALD process
APPLIED MATERIALS INC4 citations73
US9058980B1Jun 16, 2015
UV-assisted photochemical vapor deposition for damaged low K films pore sealing
APPLIED MATERIALS INC5 citations73
US8993444B2Mar 31, 2015
Method to reduce dielectric constant of a porous low-k film
APPLIED MATERIALS INC5 citations73
US9741558B2Aug 22, 2017
Selectively lateral growth of silicon oxide thin film
APPLIED MATERIALS INC3 citations72
US12368024B2Jul 22, 2025
Methods and apparatus for processing a substrate
APPLIED MATERIALS INC2 citations71
US11459652B2Oct 4, 2022
Techniques and device structures based upon directional dielectric deposition and bottom-up fill
APPLIED MATERIALS INC2 citations71
US9659765B2May 23, 2017
Enhancement of modulus and hardness for UV-cured ultra low-k dielectric films
APPLIED MATERIALS INC3 citations71
US9506145B2Nov 29, 2016
Method and hardware for cleaning UV chambers
APPLIED MATERIALS INC3 citations71
US9364871B2Jun 14, 2016
Method and hardware for cleaning UV chambers
APPLIED MATERIALS INC4 citations71
US11749564B2Sep 5, 2023
Techniques for void-free material depositions
APPLIED MATERIALS INC2 citations70
US11702742B2Jul 18, 2023
Methods of forming nucleation layers with halogenated silanes
APPLIED MATERIALS INC0 citations63
US7947611B2May 24, 2011
Method of improving initiation layer for low-k dielectric film by digital liquid flow meter
APPLIED MATERIALS INC2 citations63
US12394670B2Aug 19, 2025
Nucleation-free gap fill ALD process
APPLIED MATERIALS INC0 citations62
US12094707B2Sep 17, 2024
Plasma enhanced CVD with periodic high voltage bias
APPLIED MATERIALS INC0 citations62
US11887856B2Jan 30, 2024
Enhanced spatial ALD of metals through controlled precursor mixing
APPLIED MATERIALS INC0 citations62
US11817320B2Nov 14, 2023
CVD based oxide-metal multi structure for 3D NAND memory devices
APPLIED MATERIALS INC0 citations62
US11776805B2Oct 3, 2023
Selective oxidation and simplified pre-clean
APPLIED MATERIALS INC0 citations62
US11621160B2Apr 4, 2023
Doped and undoped vanadium oxides for low-k spacer applications
APPLIED MATERIALS INC0 citations62
US11289374B2Mar 29, 2022
Nucleation-free gap fill ALD process
APPLIED MATERIALS INC1 citations62
US11094544B2Aug 17, 2021
Methods of forming self-aligned vias
APPLIED MATERIALS INC0 citations62
US11094533B2Aug 17, 2021
Doped and undoped vanadium oxides for low-k spacer applications
APPLIED MATERIALS INC0 citations62
US11043386B2Jun 22, 2021
Enhanced spatial ALD of metals through controlled precursor mixing
APPLIED MATERIALS INC1 citations62
US9478460B2Oct 25, 2016
Cobalt selectivity improvement in selective cobalt process sequence
APPLIED MATERIALS INC2 citations62
US12228534B2Feb 18, 2025
Capacitive sensor for monitoring gas concentration
APPLIED MATERIALS INC0 citations61
CISCO TECH INC
7 patentsUS9094307B1Jul 28, 2015
Measuring latency within a networking device
CISCO TECH INC24 citations93
US10764027B2Sep 1, 2020
Deterministic calibrated synchronized network interlink access
CISCO TECH INC2 citations72
US11057305B2Jul 6, 2021
Congestion notification reporting for a responsive network
CISCO TECH INC2 citations68
US10021007B2Jul 10, 2018
Measuring latency within a networking device
CISCO TECH INC1 citations63
US11968038B2Apr 23, 2024
System and method to measure and score application health via correctable errors
CISCO TECH INC0 citations62
US11909522B2Feb 20, 2024
System and method to measure and score application health via correctable errors
CISCO TECH INC0 citations62
US11070311B2Jul 20, 2021
System and method to measure and score application health via correctable errors
CISCO TECH INC0 citations62
CHAN KELVIN
4 patentsUS7997565B1Aug 16, 2011
Compact portable air cooler
CHAN KELVIN34 citations92
US8877659B2Nov 4, 2014
Low-k dielectric damage repair by vapor-phase chemical exposure
CHAN KELVIN7 citations84
US10152467B2Dec 11, 2018
Managing a sharing of media content among client computers
CHAN KELVIN10 citations82
US8481422B2Jul 9, 2013
Prevention and reduction of solvent and solution penetration into porous dielectrics using a thin barrier layer
CHAN KELVIN6 citations82
GOOGLE LLC
2 patentsXIE BO
1 patentMASSACHUSETTS INST TECHNOLOGY
1 patentDING YIYANG JOY
1 patentShowing the top 50 of 99 patents by PatentIndex Score.