Inventor
KYOH SUIGEN
JP22 patents
⚠️ This page may combine multiple inventors who share the name “KYOH SUIGEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
14 patentsUS7194704B2Mar 20, 2007
Design layout preparing method
TOSHIBA KK61 citations97
US7266801B2Sep 4, 2007
Design pattern correction method and mask pattern producing method
TOSHIBA KK31 citations92
US6340542B1Jan 22, 2002
Method of manufacturing a semiconductor device, method of manufacturing a photomask, and a master mask
TOSHIBA KK36 citations92
US7797068B2Sep 14, 2010
Defect probability calculating method and semiconductor device manufacturing method
TOSHIBA KK9 citations84
US7917871B2Mar 29, 2011
Method and program for pattern data generation using a modification guide
TOSHIBA KK8 citations83
US7523437B2Apr 21, 2009
Pattern-producing method for semiconductor device
TOSHIBA KK6 citations74
US6635549B2Oct 21, 2003
Method of producing exposure mask
TOSHIBA KK11 citations74
US6319637B1Nov 20, 2001
Method for forming pattern
TOSHIBA KK10 citations74
US7499582B2Mar 3, 2009
Method for inspecting a defect in a photomask, method for manufacturing a semiconductor device and method for producing a photomask
TOSHIBA KK2 citations63
US6542237B1Apr 1, 2003
Exposure method for making precision patterns on a substrate
TOSHIBA KK5 citations63
US7673258B2Mar 2, 2010
Design data creating method, design data creating program product, and manufacturing method of semiconductor device
TOSHIBA KK3 citations62
US7539962B2May 26, 2009
Pattern data correcting method, photo mask manufacturing method, semiconductor device manufacturing method, program and semiconductor device
TOSHIBA KK2 citations62
US9217918B2Dec 22, 2015
Photomask, photomask manufacturing apparatus, and photomask manufacturing method
TOSHIBA KK0 citations52
US7966584B2Jun 21, 2011
Pattern-producing method for semiconductor device
TOSHIBA KK0 citations52