Inventor
AGNIHOTRI DILEEP
US10 patents
⚠️ This page may combine multiple inventors who share the name “AGNIHOTRI DILEEP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JORDAN VALLEY APPLIED RADIATION LTD
4 patentsUS7130376B2Oct 31, 2006
X-ray reflectometry of thin film layers with enhanced accuracy
JORDAN VALLEY APPLIED RADIATION LTD17 citations92
US7103142B1Sep 5, 2006
Material analysis using multiple X-ray reflectometry models
JORDAN VALLEY APPLIED RADIATION LTD19 citations92
US7062013B2Jun 13, 2006
X-ray reflectometry of thin film layers with enhanced accuracy
JORDAN VALLEY APPLIED RADIATION LTD24 citations92
US7474732B2Jan 6, 2009
Calibration of X-ray reflectometry system
JORDAN VALLEY APPLIED RADIATION LTD12 citations81
JORDAN VALLEY SEMICONDUCTORS
3 patentsUS7680243B2Mar 16, 2010
X-ray measurement of properties of nano-particles
JORDAN VALLEY SEMICONDUCTORS55 citations95
US7649978B2Jan 19, 2010
Automated selection of X-ray reflectometry measurement locations
JORDAN VALLEY SEMICONDUCTORS7 citations71
US7804934B2Sep 28, 2010
Accurate measurement of layer dimensions using XRF
JORDAN VALLEY SEMICONDUCTORS5 citations58