Inventor

LUO KUN-LUN

TW9 patents

⚠️ This page may combine multiple inventors who share the name “LUO KUN-LUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IND TECH RES INST

6 patents

US7228468B2Jun 5, 2007

Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification

IND TECH RES INST28 citations90

US7506231B2Mar 17, 2009

Wrapper testing circuits and method thereof for system-on-a-chip

IND TECH RES INST23 citations89

US7644323B2Jan 5, 2010

Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification

IND TECH RES INST11 citations82

US9459319B2Oct 4, 2016

Device and method for generating input control signals of a serialized compressed scan circuit

IND TECH RES INST8 citations81

US7319625B2Jan 15, 2008

Built-in memory current test circuit

IND TECH RES INST15 citations81

US6937106B2Aug 30, 2005

Built-in jitter measurement circuit for voltage controlled oscillator and phase locked loop

IND TECH RES INST3 citations60

WU MING-HSUEH

2 patents

US8867286B2Oct 21, 2014

Repairable multi-layer memory chip stack and method thereof

WU MING-HSUEH13 citations80

US8555123B2Oct 8, 2013

Test device and method for the SoC test architecture

WU MING-HSUEH8 citations79

LUO KUN-LUN

1 patent

US8185782B2May 22, 2012

Test device and method for hierarchical test architecture

LUO KUN-LUN6 citations66