Inventor
NISHIKAWA YOSHIHIRO
JP32 patents
⚠️ This page may combine multiple inventors who share the name “NISHIKAWA YOSHIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
4 patentsUS6975227B1Dec 13, 2005
Method for controlling coming and going personnel, and a system thereof
HITACHI LTD13 citations81
US6806450B2Oct 19, 2004
Hazardous material detection system
HITACHI LTD12 citations72
US6621414B2Sep 16, 2003
Method of controlling coming and going personnel, and a system thereof
HITACHI LTD4 citations59
US6940067B2Sep 6, 2005
Hazardous material detection system
HITACHI LTD0 citations51
CANON KK
4 patentsUS4259426AMar 31, 1981
Pressure fixable microcapsule toner and electrostatic image developing method
CANON KK15 citations74
US4760007AJul 26, 1988
Process of developing latent electrostatic image using dry magnetic developer
CANON KK5 citations63
US4517273AMay 14, 1985
Pressure fixable capsule toner
CANON KK3 citations62
US4302201ANov 24, 1981
Method for developing electrical latent images
CANON KK5 citations59
NISHIKAWA YOSHIHIRO
4 patentsUS8408888B2Apr 2, 2013
Scroll compressor having relief ports to open first and second compression chambers
NISHIKAWA YOSHIHIRO2 citations60
US9513159B2Dec 6, 2016
Solar simulator light-amount evaluation apparatus, solar simulator light-amount evaluation method, solar cell evaluation apparatus, and solar cell evaluation method
NISHIKAWA YOSHIHIRO0 citations39
US8918298B2Dec 23, 2014
Solar cell evaluation device and solar cell evaluation method
NISHIKAWA YOSHIHIRO0 citations39
US8729919B2May 20, 2014
Light source evaluation device and solar cell evaluation device
NISHIKAWA YOSHIHIRO0 citations31
KONICA MINOLTA INC
3 patentsUS11812161B2Nov 7, 2023
Flicker measuring device, flicker measuring method, and flicker measuring program
KONICA MINOLTA INC0 citations52
US11670204B2Jun 6, 2023
Residual DC measurement device, residual DC measurement method, and residual DC measurement program
KONICA MINOLTA INC0 citations52
US11490028B2Nov 1, 2022
Two-dimensional flicker measurement apparatus and two-dimensional flicker measurement method
KONICA MINOLTA INC0 citations52