Inventor
NISHIOKA NAOHISA
JP30 patents
⚠️ This page may combine multiple inventors who share the name “NISHIOKA NAOHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ELPIDA MEMORY INC
8 patentsUS8381157B2Feb 19, 2013
Semiconductor device, adjustment method thereof and data processing system
ELPIDA MEMORY INC12 citations92
US7411852B2Aug 12, 2008
Semiconductor memory device and method of adjusting same
ELPIDA MEMORY INC37 citations92
US7835206B2Nov 16, 2010
Semiconductor memory device capable of relieving defective bits found after packaging
ELPIDA MEMORY INC17 citations84
US7436729B2Oct 14, 2008
Fuse circuit and semiconductor device using fuse circuit thereof
ELPIDA MEMORY INC8 citations73
US8904071B2Dec 2, 2014
Semiconductor device, control method for the semiconductor device and information processing system including the same
ELPIDA MEMORY INC3 citations63
US8848473B2Sep 30, 2014
Semiconductor device and test method thereof
ELPIDA MEMORY INC2 citations63
US8677294B2Mar 18, 2014
Semiconductor device, adjustment method thereof and data processing system
ELPIDA MEMORY INC2 citations63
US8601188B2Dec 3, 2013
Semiconductor device, control method for the semiconductor device and information processing system including the same
ELPIDA MEMORY INC3 citations63
MICRON TECHNOLOGY INC
7 patentsUS10916489B1Feb 9, 2021
Memory core chip having TSVS
MICRON TECHNOLOGY INC14 citations86
US10930363B1Feb 23, 2021
TSV auto repair scheme on stacked die
MICRON TECHNOLOGY INC6 citations84
US10468313B2Nov 5, 2019
Apparatuses and methods for TSV resistance and short measurement in a stacked device
MICRON TECHNOLOGY INC2 citations73
US11380414B2Jul 5, 2022
TSV auto repair scheme on stacked die
MICRON TECHNOLOGY INC1 citations62
US11275111B2Mar 15, 2022
Plurality of edge through-silicon vias and related systems, methods, and devices
MICRON TECHNOLOGY INC0 citations62
US11244888B2Feb 8, 2022
Memory core chip having TSVs
MICRON TECHNOLOGY INC1 citations62
US11037843B2Jun 15, 2021
Apparatuses and methods for TSV resistance and short measurement in a stacked device
MICRON TECHNOLOGY INC1 citations62
NISHIOKA NAOHISA
6 patentsUS8593891B2Nov 26, 2013
Semiconductor device and test method thereof
NISHIOKA NAOHISA18 citations92
US8981808B2Mar 17, 2015
Semiconductor device and test method thereof
NISHIOKA NAOHISA8 citations83
US8239812B2Aug 7, 2012
Semiconductor device, adjustment method thereof and data processing system
NISHIOKA NAOHISA6 citations83
US9047989B2Jun 2, 2015
Semiconductor device, adjustment method thereof and data processing system
NISHIOKA NAOHISA2 citations62
US8638631B2Jan 28, 2014
Semiconductor device
NISHIOKA NAOHISA0 citations51
US8539410B2Sep 17, 2013
Semiconductor device, adjustment method thereof and data processing system
NISHIOKA NAOHISA0 citations51
PS4 LUXCO SARL
4 patentsUS9312031B2Apr 12, 2016
Semiconductor device and test method thereof
PS4 LUXCO SARL4 citations84
US9564203B2Feb 7, 2017
Semiconductor device, adjustment method thereof and data processing system
PS4 LUXCO SARL2 citations73
US9281076B2Mar 8, 2016
Semiconductor device
PS4 LUXCO SARL2 citations63
US9087571B2Jul 21, 2015
Semiconductor memory device, method of adjusting the same and information processing system including the same
PS4 LUXCO SARL2 citations62