Inventor

PARK BYONG CHON

KR6 patents

⚠️ This page may combine multiple inventors who share the name “PARK BYONG CHON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KOREA RES INST STANDARDS & SCI

3 patents

US10191081B2Jan 29, 2019

Measuring method for atomic force microscope

KOREA RES INST STANDARDS & SCI3 citations62

US11087952B2Aug 10, 2021

Linear structure for displacement transmission, and one-dimensional and three-dimensional micro movement device using same

KOREA RES INST STANDARDS & SCI0 citations48

US9939461B2Apr 10, 2018

Head-integrated atomic force microscope and composite microscope including same

KOREA RES INST STANDARDS & SCI0 citations37

PARK BYONG CHON

2 patents

US8153338B2Apr 10, 2012

Apparatus and method for repairing photo mask

PARK BYONG CHON6 citations66

US9009861B2Apr 14, 2015

Substrate measurement apparatus with electron distortion unit

PARK BYONG CHON0 citations39

KOREA RES INST OF STANDARDS

1 patent

US7501618B2Mar 10, 2009

Deformation method of nanometer scale material using particle beam and nano tool thereby

KOREA RES INST OF STANDARDS5 citations60