Inventor
SAKAGUCHI KAZUHIRO
JP21 patents
⚠️ This page may combine multiple inventors who share the name “SAKAGUCHI KAZUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
13 patentsUS6351835B1Feb 26, 2002
High speed LSI spectral analysis testing apparatus and method
NEC CORP23 citations92
US6205559B1Mar 20, 2001
Method and apparatus for diagnosing failure occurrence position
NEC CORP42 citations92
US6058502AMay 2, 2000
Diagnostic system analyzing frequency spectrum of electric power for diagnosing integrated circuit, method and information storage medium storing computer program for the method
NEC CORP30 citations92
US5949798ASep 7, 1999
Integrated circuit fault testing system based on power spectrum analysis of power supply current
NEC CORP34 citations92
US5801540ASep 1, 1998
Electronic circuit tester and method of testing electronic circuit
NEC CORP37 citations92
US5790565AAug 4, 1998
CMOS integrated circuit failure diagnosis apparatus and diagnostic method
NEC CORP38 citations92
US5659244AAug 19, 1997
Electronic circuit tester and method of testing electronic circuit
NEC CORP12 citations73
US7483799B2Jan 27, 2009
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
NEC CORP4 citations62
US6704675B1Mar 9, 2004
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
NEC CORP1 citations62
US6684170B2Jan 27, 2004
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
NEC CORP2 citations62
US6931336B2Aug 16, 2005
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
NEC CORP0 citations51
US6694274B2Feb 17, 2004
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
NEC CORP0 citations51
US6480011B2Nov 12, 2002
Screening of semiconductor integrated circuit devices
NEC CORP0 citations41
NEC ELECTRONICS CORP
3 patentsUS6766485B1Jul 20, 2004
Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program
NEC ELECTRONICS CORP22 citations92
US6996489B2Feb 7, 2006
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
NEC ELECTRONICS CORP8 citations73
US6973395B2Dec 6, 2005
Observation and/or failure inspection apparatus, method and program therefor
NEC ELECTRONICS CORP2 citations61
CANON KK
3 patentsUS7970817B2Jun 28, 2011
Information processing device, information processing method, and control program
CANON KK14 citations84
US8011011B2Aug 30, 2011
Method and apparatus for processing data
CANON KK2 citations62
US6510289B2Jan 21, 2003
Image formation system, control method of image formation system, image formation apparatus and storage medium thereof
CANON KK4 citations62