Inventor
SUZUKI MASAHITO
JP31 patents
⚠️ This page may combine multiple inventors who share the name “SUZUKI MASAHITO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NISSHIN STEEL CO LTD
8 patentsUS10253390B2Apr 9, 2019
Method of manufacturing a cold-rolled steel plate
NISSHIN STEEL CO LTD0 citations49
US10246764B2Apr 2, 2019
Method of manufacturing a cold-rolled steel plate
NISSHIN STEEL CO LTD0 citations49
US10197109B2Feb 5, 2019
Clutch plate for multiplate wet clutch and method of manufacturing the same
NISSHIN STEEL CO LTD0 citations49
US10161462B2Dec 25, 2018
Clutch plate for multiplate wet clutch and method of manufacturing the same
NISSHIN STEEL CO LTD0 citations49
US10144994B2Dec 4, 2018
Cold-rolled steel plate and method of manufacturing the same
NISSHIN STEEL CO LTD0 citations49
US10060004B2Aug 28, 2018
Cold-rolled steel plate and method of manufacturing the same
NISSHIN STEEL CO LTD0 citations49
US10208368B2Feb 19, 2019
Cold-rolled steel plate and method of manufacturing the same
NISSHIN STEEL CO LTD0 citations48
US10081854B2Sep 25, 2018
Method of manufacturing a cold-rolled steel plate
NISSHIN STEEL CO LTD0 citations48
HITACHI LTD
5 patentsUS6519148B2Feb 11, 2003
Liquid cooling system for notebook computer
HITACHI LTD112 citations98
US6519147B2Feb 11, 2003
Notebook computer having a liquid cooling device
HITACHI LTD66 citations95
US6791834B2Sep 14, 2004
Liquid cooling system for notebook computer
HITACHI LTD33 citations92
US6614655B2Sep 2, 2003
Method of controlling cooling system for a personal computer and personal computer
HITACHI LTD6 citations73
US6879485B2Apr 12, 2005
Method of controlling cooling system for a personal computer and personal computer
HITACHI LTD4 citations62
FUJITSU LTD
3 patentsUS6359818B2Mar 19, 2002
Apparatus for analyzing failure for semiconductor memory device
FUJITSU LTD22 citations92
US6549478B2Apr 15, 2003
Scan register circuit for scanning data for determining failure in a semiconductor device
FUJITSU LTD10 citations74
US6910166B2Jun 21, 2005
Method of and apparatus for timing verification of LSI test data and computer product
FUJITSU LTD6 citations62