Inventor
TESDAHL CURTIS A
US6 patents
Patents
6 patentsUS6930494B2Aug 16, 2005
Capacitive probe assembly with flex circuit
AGILENT TECHNOLOGIES INC61 citations95
US7109728B2Sep 19, 2006
Probe based information storage for probes used for opens detection in in-circuit testing
AGILENT TECHNOLOGIES INC16 citations91
US6998849B2Feb 14, 2006
Capacitive sensor measurement method for discrete time sampled system for in-circuit test
AGILENT TECHNOLOGIES INC11 citations82
US7492170B2Feb 17, 2009
Probe based information storage for probes used for opens detection in in-circuit testing
AGILENT TECHNOLOGIES INC7 citations72
US7132834B2Nov 7, 2006
Capacitive sensor measurement method for discrete time sampled system for in-circuit test
AGILENT TECHNOLOGIES INC9 citations72
US7061250B2Jun 13, 2006
Capacitive sensor measurement method for discrete time sampled system for in-circuit test
AGILENT TECHNOLOGIES INC10 citations72