Inventor
BURDINE TODD MICHAEL
US4 patents
Patents
4 patentsUS7107502B2Sep 12, 2006
Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD)
IBM22 citations88
US7225374B2May 29, 2007
ABIST-assisted detection of scan chain defects
IBM29 citations86
US7395469B2Jul 1, 2008
Method for implementing deterministic based broken scan chain diagnostics
IBM12 citations80
US7475308B2Jan 6, 2009
implementing deterministic based broken scan chain diagnostics
IBM2 citations58