Inventor

FORLENZA DONATO ORAZIO

US7 patents

⚠️ This page may combine multiple inventors who share the name “FORLENZA DONATO ORAZIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

5 patents

US5640402AJun 17, 1997

Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)

IBM6 citations61

US7475308B2Jan 6, 2009

implementing deterministic based broken scan chain diagnostics

IBM2 citations58

FORLENZA DONATO ORAZIO

2 patents

US8086924B2Dec 27, 2011

Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns

FORLENZA DONATO ORAZIO13 citations79

US8065575B2Nov 22, 2011

Implementing isolation of VLSI scan chain using ABIST test patterns

FORLENZA DONATO ORAZIO0 citations37

FORLENZA DONATO ORAZIO

IBM

Fast flush load of LSSD SRL chains

ABIST-assisted detection of scan chain defects

Method for implementing deterministic based broken scan chain diagnostics

Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)

implementing deterministic based broken scan chain diagnostics

FORLENZA DONATO ORAZIO

Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns

Implementing isolation of VLSI scan chain using ABIST test patterns