Inventor

FORLENZA ORAZIO PASQUALE

US7 patents

⚠️ This page may combine multiple inventors who share the name “FORLENZA ORAZIO PASQUALE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

5 patents

US7225374B2May 29, 2007

ABIST-assisted detection of scan chain defects

IBM29 citations86

US7395469B2Jul 1, 2008

Method for implementing deterministic based broken scan chain diagnostics

IBM12 citations80

US7921346B2Apr 5, 2011

Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)

IBM6 citations61

US7475308B2Jan 6, 2009

implementing deterministic based broken scan chain diagnostics

IBM2 citations58

US11378623B2Jul 5, 2022

Diagnostic enhancement for multiple instances of identical structures

IBM0 citations47

FORLENZA DONATO ORAZIO

2 patents

US8086924B2Dec 27, 2011

Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns

FORLENZA DONATO ORAZIO13 citations79

US8065575B2Nov 22, 2011

Implementing isolation of VLSI scan chain using ABIST test patterns

FORLENZA DONATO ORAZIO0 citations37