Inventor

HURLEY WILLIAM JAMES

US3 patents

Patents

3 patents

US7225374B2May 29, 2007

ABIST-assisted detection of scan chain defects

IBM29 citations86

US7395469B2Jul 1, 2008

Method for implementing deterministic based broken scan chain diagnostics

IBM12 citations80

US7475308B2Jan 6, 2009

implementing deterministic based broken scan chain diagnostics

IBM2 citations58