Inventor
TRAN PHONG T
US22 patents
⚠️ This page may combine multiple inventors who share the name “TRAN PHONG T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS6961886B2Nov 1, 2005
Diagnostic method for structural scan chain designs
IBM59 citations96
US7908532B2Mar 15, 2011
Automated system and processing for expedient diagnosis of broken shift registers latch chains
IBM22 citations91
US9552449B1Jan 24, 2017
Dynamic fault model generation for diagnostics simulation and pattern generation
IBM6 citations84
US7908534B2Mar 15, 2011
Diagnosable general purpose test registers scan chain design
IBM9 citations84
US7934134B2Apr 26, 2011
Method and apparatus for performing logic built-in self-testing of an integrated circuit
IBM11 citations83
US7930601B2Apr 19, 2011
AC ABIST diagnostic method, apparatus and program product
IBM11 citations82
US7395469B2Jul 1, 2008
Method for implementing deterministic based broken scan chain diagnostics
IBM12 citations80
US10024910B2Jul 17, 2018
Iterative N-detect based logic diagnostic technique
IBM3 citations73
US9852245B2Dec 26, 2017
Dynamic fault model generation for diagnostics simulation and pattern generation
IBM3 citations73
US7392449B2Jun 24, 2008
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
IBM7 citations72
US7831863B2Nov 9, 2010
Method for enhancing the diagnostic accuracy of a VLSI chip
IBM5 citations63
US7921346B2Apr 5, 2011
Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)
IBM6 citations61
US7395470B2Jul 1, 2008
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
IBM4 citations61
US11940271B2Mar 26, 2024
High power device fault localization via die surface contouring
IBM0 citations60
US10768230B2Sep 8, 2020
Built-in device testing of integrated circuits
IBM1 citations59
US7475308B2Jan 6, 2009
implementing deterministic based broken scan chain diagnostics
IBM2 citations58
US10254336B2Apr 9, 2019
Iterative N-detect based logic diagnostic technique
IBM0 citations52
US10169510B2Jan 1, 2019
Dynamic fault model generation for diagnostics simulation and pattern generation
IBM0 citations52