Inventor

MAZNEV ALEXEI

US6 patents

⚠️ This page may combine multiple inventors who share the name “MAZNEV ALEXEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED METROLOGY SYSTEMS LLC

4 patents

US7327468B2Feb 5, 2008

Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films

ADVANCED METROLOGY SYSTEMS LLC17 citations78

US7365864B2Apr 29, 2008

Method of determining properties of patterned thin film metal structures using transient thermal response

ADVANCED METROLOGY SYSTEMS LLC2 citations59

US7499183B2Mar 3, 2009

Method of measuring sub-micron trench structures

ADVANCED METROLOGY SYSTEMS LLC3 citations58

US7839509B2Nov 23, 2010

Method of measuring deep trenches with model-based optical spectroscopy

ADVANCED METROLOGY SYSTEMS LLC0 citations36

ACTIVE IMPULSE SYSTEMS INC

1 patent

US6069703AMay 30, 2000

Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure

ACTIVE IMPULSE SYSTEMS INC69 citations94

MAZNEV ALEXEI

1 patent

US10241058B2Mar 26, 2019

Systems and methods for quality control of a periodic structure

MAZNEV ALEXEI1 citations45