Inventor
MAYER ELMAR
DE32 patents
⚠️ This page may combine multiple inventors who share the name “MAYER ELMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HEIDENHAIN GMBH DR JOHANNES
19 patentsUS6198534B1Mar 6, 2001
Scanning unit for an optical position measuring system
HEIDENHAIN GMBH DR JOHANNES55 citations96
US6963409B2Nov 8, 2005
Optical position measuring device
HEIDENHAIN GMBH DR JOHANNES22 citations92
US6603114B1Aug 5, 2003
Scanning head comprising a semiconductor substrate with a blind hole containing a light source
HEIDENHAIN GMBH DR JOHANNES34 citations92
US6472658B2Oct 29, 2002
Photoelectric position measuring system that optimizes modulation of a scanning device and the intensity of a reference mark signal
HEIDENHAIN GMBH DR JOHANNES31 citations92
US6742275B2Jun 1, 2004
Scale and position measuring system for absolute position determination
HEIDENHAIN GMBH DR JOHANNES15 citations83
US6519044B1Feb 11, 2003
Scanner unit for an optical position measuring device
HEIDENHAIN GMBH DR JOHANNES15 citations82
US7084390B2Aug 1, 2006
Position-measuring device including measuring graduation and scanning unit
HEIDENHAIN GMBH DR JOHANNES8 citations74
US10260908B2Apr 16, 2019
Position measuring device and method for operating a position measuring device
HEIDENHAIN GMBH DR JOHANNES3 citations64
US7787970B2Aug 31, 2010
Position-measuring device and method for position measuring
HEIDENHAIN GMBH DR JOHANNES4 citations63
US7835014B2Nov 16, 2010
Position measuring arrangement
HEIDENHAIN GMBH DR JOHANNES3 citations62
US7235776B2Jun 26, 2007
Method and device for regulating a light source of a position-measuring unit
HEIDENHAIN GMBH DR JOHANNES3 citations62
US7230726B2Jun 12, 2007
Scanning unit for a position measuring instrument for optical scanning of a object measuring graduation
HEIDENHAIN GMBH DR JOHANNES2 citations62
US7164482B2Jan 16, 2007
Position measuring system
HEIDENHAIN GMBH DR JOHANNES2 citations62
US7719075B2May 18, 2010
Scanning head for optical position-measuring systems
HEIDENHAIN GMBH DR JOHANNES2 citations58
US10197388B2Feb 5, 2019
Position-measuring device able to monitor deviations from a setpoint behavior and method for operating the position-measuring device
HEIDENHAIN GMBH DR JOHANNES1 citations56
US11537294B2Dec 27, 2022
Position-measuring device and method for operating the same
HEIDENHAIN GMBH DR JOHANNES0 citations52
US7847704B2Dec 7, 2010
Method and device for transmitting signals from a position measuring arrangement to an evaluation unit
HEIDENHAIN GMBH DR JOHANNES1 citations51
USRE40676EMar 24, 2009
Scanner unit for an optical position measuring device
HEIDENHAIN GMBH DR JOHANNES1 citations50
US10260909B2Apr 16, 2019
Position measuring device
HEIDENHAIN GMBH DR JOHANNES0 citations42
MAYER ELMAR
5 patentsUS8154427B2Apr 10, 2012
Multiturn rotary encoder and method of operating a multiturn rotary encoder
MAYER ELMAR9 citations82
US8825439B2Sep 2, 2014
Multiturn rotary encoder
MAYER ELMAR3 citations59
US8820623B2Sep 2, 2014
Position-measuring device
MAYER ELMAR3 citations59
US10120359B2Nov 6, 2018
Device and method for the automated detection of an interface
MAYER ELMAR0 citations37
US8476580B2Jul 2, 2013
Angle-measuring device and line of products with such angle-measuring devices
MAYER ELMAR0 citations37