Inventor
GIRMONSKY DORON
IL11 patents
⚠️ This page may combine multiple inventors who share the name “GIRMONSKY DORON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
5 patentsUS11423529B2Aug 23, 2022
Determination of defect location for examination of a specimen
APPLIED MATERIALS ISRAEL LTD2 citations68
US12480898B2Nov 25, 2025
Z-profiling of wafers based on X-ray measurements
APPLIED MATERIALS ISRAEL LTD1 citations59
US11301983B2Apr 12, 2022
Measuring height difference in patterns on semiconductor wafers
APPLIED MATERIALS ISRAEL LTD0 citations58
US10748272B2Aug 18, 2020
Measuring height difference in patterns on semiconductor wafers
APPLIED MATERIALS ISRAEL LTD0 citations48
US10504693B2Dec 10, 2019
Evaluating an object
APPLIED MATERIALS ISRAEL LTD0 citations43