Inventor
LEMBRIKOV PAVEL B
US14 patents
⚠️ This page may combine multiple inventors who share the name “LEMBRIKOV PAVEL B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICROFABRICA INC
10 patentsUS7265565B2Sep 4, 2007
Cantilever microprobes for contacting electronic components and methods for making such probes
MICROFABRICA INC65 citations98
US7511523B2Mar 31, 2009
Cantilever microprobes for contacting electronic components and methods for making such probes
MICROFABRICA INC46 citations96
US10416192B2Sep 17, 2019
Cantilever microprobes for contacting electronic components
MICROFABRICA INC18 citations94
US7557595B2Jul 7, 2009
Cantilever microprobes for contacting electronic components and methods for making such probes
MICROFABRICA INC26 citations94
US7679388B2Mar 16, 2010
Cantilever microprobes for contacting electronic components and methods for making such probes
MICROFABRICA INC15 citations92
US7640651B2Jan 5, 2010
Fabrication process for co-fabricating multilayer probe array and a space transformer
MICROFABRICA INC25 citations92
US7527721B2May 5, 2009
Electrochemical fabrication method for producing multi-layer three-dimensional structures on a porous dielectric
MICROFABRICA INC24 citations92
US10788512B2Sep 29, 2020
Cantilever microprobes for contacting electronic components
MICROFABRICA INC13 citations86
US7878385B2Feb 1, 2011
Probe arrays and method for making
MICROFABRICA INC12 citations84
US7265562B2Sep 4, 2007
Cantilever microprobes for contacting electronic components and methods for making such probes
MICROFABRICA INC14 citations84
CHEN RICHARD T
4 patentsUS8729916B2May 20, 2014
Methods of creating probe structures from a plurality of planar layers
CHEN RICHARD T18 citations92
US8723543B2May 13, 2014
Methods of creating probe structures from a plurality of planar layers
CHEN RICHARD T15 citations92
US8717054B2May 6, 2014
Methods of creating probe structures from a plurality of planar layers
CHEN RICHARD T16 citations92
US8717055B2May 6, 2014
Probe devices formed from multiple planar layers of structural material with tip regions formed from one or more intermediate planar layers
CHEN RICHARD T17 citations92