Inventor
MIN CHUNG-CHIANG
TW37 patents
⚠️ This page may combine multiple inventors who share the name “MIN CHUNG-CHIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
35 patentsUS9536969B2Jan 3, 2017
Self-aligned split gate flash memory
TAIWAN SEMICONDUCTOR MFG CO LTD22 citations94
US10454021B2Oct 22, 2019
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD12 citations92
US9711508B2Jul 18, 2017
Capacitor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US11818962B2Nov 14, 2023
Sidewall spacer structure for memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11342379B2May 24, 2022
Trench formation scheme for programmable metallization cell to prevent metal redeposit
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11121308B2Sep 14, 2021
Sidewall spacer structure for memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11088202B2Aug 10, 2021
Method of forming memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10720568B2Jul 21, 2020
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9564448B2Feb 7, 2017
Flash memory structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US12501842B2Dec 16, 2025
Non-volatile memory device and manufacturing technology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12477746B2Nov 18, 2025
Method of forming memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12444650B2Oct 14, 2025
Etch stop layer for memory device formation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12354695B2Jul 8, 2025
Trench formation scheme for programmable metallization cell to prevent metal redeposit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12274182B2Apr 8, 2025
Sidewall spacer structure for memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12027420B2Jul 2, 2024
Etch stop layer for memory device formation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11925032B2Mar 5, 2024
Memory device with flat-top bottom electrodes and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11785786B2Oct 10, 2023
Trench formation scheme for programmable metallization cell to prevent metal redeposit
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11785861B2Oct 10, 2023
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11665911B2May 30, 2023
Method of forming memory cell
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11495743B2Nov 8, 2022
Non-volatile memory device and manufacturing technology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11437431B2Sep 6, 2022
Memory device with flat-top bottom electrodes and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11380580B2Jul 5, 2022
Etch stop layer for memory device formation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11362265B2Jun 14, 2022
Semiconductor structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12302767B2May 13, 2025
Buffer layer in memory cell to prevent metal redeposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11532785B2Dec 20, 2022
Buffer layer in memory cell to prevent metal redeposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10872895B2Dec 22, 2020
Method of manufacturing capacitor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10825825B2Nov 3, 2020
Flash memory structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10355011B2Jul 16, 2019
Method for forming flash memory structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10276584B2Apr 30, 2019
Method to control the common drain of a pair of control gates and to improve inter-layer dielectric (ILD) filling between the control gates
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9859295B2Jan 2, 2018
Method for forming flash memory structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9799665B2Oct 24, 2017
Method for forming semiconductor device structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9786674B2Oct 10, 2017
Discrete storage element formation for thin-film storage device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9673204B2Jun 6, 2017
Semiconductor device structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9570457B2Feb 14, 2017
Method to control the common drain of a pair of control gates and to improve inter-layer dielectric (ILD) filling between the control gates
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9048316B2Jun 2, 2015
Flash memory structure and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52