Inventor
HAGERUP WILLIAM A
US24 patents
Patents
24 patentsUS6477054B1Nov 5, 2002
Low temperature co-fired ceramic substrate structure having a capacitor and thermally conductive via
TEKTRONIX INC99 citations97
US7056134B2Jun 6, 2006
Attachable/detachable probing tip system for a measurement probing system
TEKTRONIX INC39 citations92
US6967473B1Nov 22, 2005
Attachable/detachable variable spacing probing tip system
TEKTRONIX INC40 citations92
US6373348B1Apr 16, 2002
High speed differential attenuator using a low temperature co-fired ceramic substrate
TEKTRONIX INC51 citations92
US7460983B2Dec 2, 2008
Signal analysis system and calibration method
TEKTRONIX INC30 citations89
US10041975B2Aug 7, 2018
Automatic probe ground connection checking techniques
TEKTRONIX INC4 citations84
US9194888B2Nov 24, 2015
Automatic probe ground connection checking techniques
TEKTRONIX INC7 citations84
US7251265B2Jul 31, 2007
Micro-cavity laser having increased sensitivity
TEKTRONIX INC19 citations84
US7049843B2May 23, 2006
Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages
TEKTRONIX INC15 citations84
US9810715B2Nov 7, 2017
High impedance compliant probe tip
TEKTRONIX INC9 citations82
US10241133B2Mar 26, 2019
Probe tip and probe assembly
TEKTRONIX INC8 citations80
US7994801B2Aug 9, 2011
Calibrated S-parameter measurements of a high impedance probe
TEKTRONIX INC7 citations76
US10168356B2Jan 1, 2019
Test and measurement probe with adjustable test point contact
TEKTRONIX INC4 citations73
US9772391B2Sep 26, 2017
Method for probe equalization
TEKTRONIX INC4 citations73
US6659812B2Dec 9, 2003
Surface mount probe point socket and system
TEKTRONIX INC7 citations73
US7402991B2Jul 22, 2008
Wide bandwidth attenuator input circuit for a measurement probe
TEKTRONIX INC6 citations72
US7256575B2Aug 14, 2007
Wide bandwidth attenuator input circuit for a measurement probe
TEKTRONIX INC9 citations72
US11454651B2Sep 27, 2022
Automatic probe ground connection checking techniques
TEKTRONIX INC0 citations62
US11249111B2Feb 15, 2022
Automatic probe ground connection checking techniques
TEKTRONIX INC0 citations62
US7424177B2Sep 9, 2008
Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity
TEKTRONIX INC2 citations62
US7310455B2Dec 18, 2007
Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity
TEKTRONIX INC5 citations62
US7221813B2May 22, 2007
Signal acquisition probing and voltage measurement systems using an electro-optical cavity
TEKTRONIX INC3 citations62
US10119992B2Nov 6, 2018
High impedance compliant probe tip
TEKTRONIX INC0 citations48
US7187187B2Mar 6, 2007
Signal acquisition probing system using a micro-cavity laser
TEKTRONIX INC0 citations41