Inventor

Lindenfeld Ze'ev

IL2 patents

⚠️ This page may combine multiple inventors who share the name “Lindenfeld Ze'ev”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA CORP

1 patent

US10831108B2Nov 10, 2020

Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology

KLA CORP5 citations66

NOVA LTD

1 patent

US11366398B2Jun 21, 2022

Time-domain optical metrology and inspection of semiconductor devices

NOVA LTD0 citations44