Inventor
AMIR NURIEL
IL35 patents
⚠️ This page may combine multiple inventors who share the name “AMIR NURIEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
23 patentsUS10527951B2Jan 7, 2020
Compound imaging metrology targets
KLA TENCOR CORP18 citations85
US9885961B1Feb 6, 2018
Partly disappearing targets
KLA TENCOR CORP8 citations84
US9329033B2May 3, 2016
Method for estimating and correcting misregistration target inaccuracy
KLA TENCOR CORP8 citations82
US10890436B2Jan 12, 2021
Overlay targets with orthogonal underlayer dummyfill
KLA TENCOR CORP4 citations73
US9903813B2Feb 27, 2018
Overlay measurement of pitch walk in multiply patterned targets
KLA TENCOR CORP2 citations73
US9841370B2Dec 12, 2017
Multi-layered target design
KLA TENCOR CORP5 citations73
US9760020B2Sep 12, 2017
In-situ metrology
KLA TENCOR CORP3 citations73
US10551749B2Feb 4, 2020
Metrology targets with supplementary structures in an intermediate layer
KLA TENCOR CORP3 citations72
US10415963B2Sep 17, 2019
Estimating and eliminating inter-cell process variation inaccuracy
KLA TENCOR CORP2 citations72
US10303835B2May 28, 2019
Method and apparatus for direct self assembly in target design and production
KLA TENCOR CORP2 citations72
US10002806B2Jun 19, 2018
Metrology targets with filling elements that reduce inaccuracies and maintain contrast
KLA TENCOR CORP6 citations72
US9903711B2Feb 27, 2018
Feed forward of metrology data in a metrology system
KLA TENCOR CORP5 citations71
US10726169B2Jul 28, 2020
Target and process sensitivity analysis to requirements
KLA TENCOR CORP3 citations70
US10242290B2Mar 26, 2019
Method, system, and user interface for metrology target characterization
KLA TENCOR CORP2 citations69
US9934353B2Apr 3, 2018
Focus measurements using scatterometry metrology
KLA TENCOR CORP5 citations69
US11709433B2Jul 25, 2023
Device-like metrology targets
KLA TENCOR CORP0 citations62
US11060845B2Jul 13, 2021
Polarization measurements of metrology targets and corresponding target designs
KLA TENCOR CORP0 citations62
US10698321B2Jun 30, 2020
Process compatible segmented targets and design methods
KLA TENCOR CORP1 citations62
US10458777B2Oct 29, 2019
Polarization measurements of metrology targets and corresponding target designs
KLA TENCOR CORP0 citations52
US10025285B2Jul 17, 2018
On-product derivation and adjustment of exposure parameters in a directed self-assembly process
KLA TENCOR CORP0 citations52
US9753364B2Sep 5, 2017
Producing resist layers using fine segmentation
KLA TENCOR CORP0 citations52
US9740108B2Aug 22, 2017
Scatterometry overlay metrology targets and methods
KLA TENCOR CORP0 citations52
US10008364B2Jun 26, 2018
Alignment of multi-beam patterning tool
KLA TENCOR CORP0 citations42
KORNIT DIGITAL LTD
6 patentsUS11851300B2Dec 26, 2023
Loading mechanism for shirts
KORNIT DIGITAL LTD2 citations71
US10899142B2Jan 26, 2021
Digital printing apparatus and method for printing of irregular shaped three dimensional items
KORNIT DIGITAL LTD5 citations65
US12275610B2Apr 15, 2025
Loading mechanism for shirts
KORNIT DIGITAL LTD0 citations61
US11673410B2Jun 13, 2023
Rotary printer for textiles
KORNIT DIGITAL LTD0 citations55
US11639277B2May 2, 2023
Loading mechanism for shirts
KORNIT DIGITAL LTD0 citations54
US11752787B2Sep 12, 2023
Gripper mechanism for garment printer
KORNIT DIGITAL LTD0 citations51