Inventor
RATHERT ROBERT J
US11 patents
⚠️ This page may combine multiple inventors who share the name “RATHERT ROBERT J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA CORP
9 patentsUS11614480B2Mar 28, 2023
System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures
KLA CORP3 citations69
US11293970B2Apr 5, 2022
Advanced in-line part average testing
KLA CORP4 citations65
US11899065B2Feb 13, 2024
System and method to weight defects with co-located modeled faults
KLA CORP0 citations49
US11798827B2Oct 24, 2023
Systems and methods for semiconductor adaptive testing using inline defect part average testing
KLA CORP0 citations49
US11656274B2May 23, 2023
Systems and methods for evaluating the reliability of semiconductor die packages
KLA CORP0 citations49
US11624775B2Apr 11, 2023
Systems and methods for semiconductor defect-guided burn-in and system level tests
KLA CORP0 citations48
US12332182B2Jun 17, 2025
System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data
KLA CORP0 citations47
US11754625B2Sep 12, 2023
System and method for identifying latent reliability defects in semiconductor devices
KLA CORP0 citations47
US12422376B2Sep 23, 2025
Imaging reflectometry for inline screening
KLA CORP0 citations46