Inventor
CHANG KEN-YU
TW37 patents
⚠️ This page may combine multiple inventors who share the name “CHANG KEN-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
35 patentsUS8962473B2Feb 24, 2015
Method of forming hybrid diffusion barrier layer and semiconductor device thereof
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10361120B2Jul 23, 2019
Conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations83
US11062941B2Jul 13, 2021
Contact conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10580693B2Mar 3, 2020
Contact conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10504834B2Dec 10, 2019
Contact structure and the method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11929314B2Mar 12, 2024
Interconnect structures including a fin structure and a metal cap
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12588268B2Mar 24, 2026
Liner-free conductive structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12400853B2Aug 26, 2025
Method of forming conductive feature including cleaning step
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12252783B2Mar 18, 2025
Chemical vapor deposition for uniform tungsten growth
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12148659B2Nov 19, 2024
Contact conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12057397B2Aug 6, 2024
Capping layer for liner-free conductive structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12020981B2Jun 25, 2024
Conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11955329B2Apr 9, 2024
Method of forming conductive feature including cleaning step
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11798843B2Oct 24, 2023
Conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11676859B2Jun 13, 2023
Contact conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11670499B2Jun 6, 2023
Method of forming conductive feature including cleaning step
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11594609B2Feb 28, 2023
Liner-free conductive structures
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11521929B2Dec 6, 2022
Capping layer for liner-free conductive structures
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11195791B2Dec 7, 2021
Method for forming semiconductor contact structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10971396B2Apr 6, 2021
Conductive feature formation and structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12300539B2May 13, 2025
Source/drain contact formation methods and devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11742240B2Aug 29, 2023
Source/drain contact formation methods and devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11257712B2Feb 22, 2022
Source/drain contact formation methods and devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12433006B2Sep 30, 2025
Semiconductor device with conductive liners over silicide structures and method of making the semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12191199B2Jan 7, 2025
Contact metallization process
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11817384B2Nov 14, 2023
Interconnect structure and manufacturing method for the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11217524B1Jan 4, 2022
Interconnect structure and manufacturing method for the same
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US10964590B2Mar 30, 2021
Contact metallization process
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US10504832B2Dec 10, 2019
Method for manufacturing copper layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9812397B2Nov 7, 2017
Method of forming hybrid diffusion barrier layer and semiconductor device thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12327788B2Jun 10, 2025
Gate to source drain interconnects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12249566B1Mar 11, 2025
3DIC with gap-fill structures and the method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9437485B2Sep 6, 2016
Method for line stress reduction through dummy shoulder structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12362198B2Jul 15, 2025
Interface tool and methods of operation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations46
US10332789B2Jun 25, 2019
Semiconductor device with TiN adhesion layer for forming a contact plug
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations40