P

Inventor

CHANG KEN-YU

TW37 patents
⚠️ This page may combine multiple inventors who share the name “CHANG KEN-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

35 patents
US8962473B2Feb 24, 2015

Method of forming hybrid diffusion barrier layer and semiconductor device thereof

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US10361120B2Jul 23, 2019

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD8 citations83
US11062941B2Jul 13, 2021

Contact conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10580693B2Mar 3, 2020

Contact conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10504834B2Dec 10, 2019

Contact structure and the method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11929314B2Mar 12, 2024

Interconnect structures including a fin structure and a metal cap

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12588268B2Mar 24, 2026

Liner-free conductive structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12400853B2Aug 26, 2025

Method of forming conductive feature including cleaning step

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12252783B2Mar 18, 2025

Chemical vapor deposition for uniform tungsten growth

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12148659B2Nov 19, 2024

Contact conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12057397B2Aug 6, 2024

Capping layer for liner-free conductive structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12020981B2Jun 25, 2024

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11955329B2Apr 9, 2024

Method of forming conductive feature including cleaning step

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11798843B2Oct 24, 2023

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11676859B2Jun 13, 2023

Contact conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11670499B2Jun 6, 2023

Method of forming conductive feature including cleaning step

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11594609B2Feb 28, 2023

Liner-free conductive structures

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11521929B2Dec 6, 2022

Capping layer for liner-free conductive structures

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11195791B2Dec 7, 2021

Method for forming semiconductor contact structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10971396B2Apr 6, 2021

Conductive feature formation and structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12300539B2May 13, 2025

Source/drain contact formation methods and devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11742240B2Aug 29, 2023

Source/drain contact formation methods and devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11257712B2Feb 22, 2022

Source/drain contact formation methods and devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12433006B2Sep 30, 2025

Semiconductor device with conductive liners over silicide structures and method of making the semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12191199B2Jan 7, 2025

Contact metallization process

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11817384B2Nov 14, 2023

Interconnect structure and manufacturing method for the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11217524B1Jan 4, 2022

Interconnect structure and manufacturing method for the same

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US10964590B2Mar 30, 2021

Contact metallization process

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US10504832B2Dec 10, 2019

Method for manufacturing copper layer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9812397B2Nov 7, 2017

Method of forming hybrid diffusion barrier layer and semiconductor device thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12327788B2Jun 10, 2025

Gate to source drain interconnects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12249566B1Mar 11, 2025

3DIC with gap-fill structures and the method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US9437485B2Sep 6, 2016

Method for line stress reduction through dummy shoulder structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12362198B2Jul 15, 2025

Interface tool and methods of operation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations46
US10332789B2Jun 25, 2019

Semiconductor device with TiN adhesion layer for forming a contact plug

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations40

TAIWAN SEMICONDUCTOR MFG

1 patent

KUO CHENG CHENG

1 patent