Inventor
TOGO MITSUHIRO
JP28 patents
⚠️ This page may combine multiple inventors who share the name “TOGO MITSUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANDISK TECHNOLOGIES LLC
10 patentsUS11450768B2Sep 20, 2022
High voltage field effect transistor with vertical current paths and method of making the same
SANDISK TECHNOLOGIES LLC3 citations73
US12015084B2Jun 18, 2024
Field effect transistors with gate fins and method of making the same
SANDISK TECHNOLOGIES LLC2 citations72
US11967626B2Apr 23, 2024
Field effect transistors with gate fins and method of making the same
SANDISK TECHNOLOGIES LLC2 citations72
US11837640B2Dec 5, 2023
Transistors with stepped contact via structures and methods of forming the same
SANDISK TECHNOLOGIES LLC2 citations72
US11575015B2Feb 7, 2023
High voltage field effect transistors with self-aligned silicide contacts and methods for making the same
SANDISK TECHNOLOGIES LLC3 citations72
US11322597B2May 3, 2022
Gate material-based capacitor and resistor structures and methods of forming the same
SANDISK TECHNOLOGIES LLC3 citations71
US12279445B2Apr 15, 2025
Field effect transistors with gate fins and method of making the same
SANDISK TECHNOLOGIES LLC0 citations52
US11978774B2May 7, 2024
High voltage field effect transistor with vertical current paths and method of making the same
SANDISK TECHNOLOGIES LLC0 citations52
US11626397B2Apr 11, 2023
Gate material-based capacitor and resistor structures and methods of forming the same
SANDISK TECHNOLOGIES LLC0 citations50
US12356704B2Jul 8, 2025
Field effect transistor with contact via structures that are laterally spaced by a sub-lithographic distance and method of making the same
SANDISK TECHNOLOGIES LLC0 citations46
GLOBALFOUNDRIES INC
7 patentsUS9698241B1Jul 4, 2017
Integrated circuits with replacement metal gates and methods for fabricating the same
GLOBALFOUNDRIES INC28 citations94
US9209186B1Dec 8, 2015
Threshold voltage control for mixed-type non-planar semiconductor devices
GLOBALFOUNDRIES INC20 citations92
US9362284B2Jun 7, 2016
Threshold voltage control for mixed-type non-planar semiconductor devices
GLOBALFOUNDRIES INC7 citations84
US9679990B2Jun 13, 2017
Semiconductor structure(s) with extended source/drain channel interfaces and methods of fabrication
GLOBALFOUNDRIES INC2 citations71
US9508602B2Nov 29, 2016
Temperature-controlled implanting of a diffusion-suppressing dopant in a semiconductor structure
GLOBALFOUNDRIES INC2 citations62
US9419103B2Aug 16, 2016
Stress modulation in field effect transistors in reducing contact resistance and increasing charge carrier mobility
GLOBALFOUNDRIES INC2 citations62
US10325824B2Jun 18, 2019
Methods, apparatus and system for threshold voltage control in FinFET devices
GLOBALFOUNDRIES INC0 citations39
NEC CORP
7 patentsUS6249017B1Jun 19, 2001
Highly reliable trench capacitor type memory cell
NEC CORP17 citations92
US6124176ASep 26, 2000
Method of producing a semiconductor device with reduced fringe capacitance and short channel effect
NEC CORP19 citations92
US6063694AMay 16, 2000
Field-effect transistor with a trench isolation structure and a method for manufacturing the same
NEC CORP24 citations92
US6051861AApr 18, 2000
Semiconductor device with reduced fringe capacitance and short channel effect
NEC CORP18 citations92
US6459126B1Oct 1, 2002
Semiconductor device including a MIS transistor
NEC CORP33 citations91
US6300211B1Oct 9, 2001
Highly reliable trench capacitor type memory cell
NEC CORP10 citations73
US6159809ADec 12, 2000
Method for manufacturing surface channel type P-channel MOS transistor while suppressing P-type impurity penetration
NEC CORP4 citations62
NEC ELECTRONICS CORP
2 patentsUS7442632B2Oct 28, 2008
Semiconductor device n-channel type MOS transistor with gate electrode layer featuring small average polycrystalline silicon grain size
NEC ELECTRONICS CORP2 citations63
US7355256B2Apr 8, 2008
MOS Devices with different gate lengths and different gate polysilicon grain sizes
NEC ELECTRONICS CORP4 citations62