Inventor

RICHMOND II DONALD P

US42 patents

⚠️ This page may combine multiple inventors who share the name “RICHMOND II DONALD P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RICHMOND II DONALD P

AEHR TEST SYSTEMS

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

Apparatus for testing electronic devices

Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion

Contactor assembly for testing electrical circuits

Separate test electronics and blower modules in an apparatus for testing an integrated circuit

System for testing an integrated circuit of a device and its method of use

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

Contactor assembly for testing electrical circuits

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

System for testing an integrated circuit of a device and its method of use

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Electronics tester with power saving state

Apparatus for testing electronic devices

Electronics tester

System for testing an integrated circuit of a device and its method of use

Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode

Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode

Electronics tester with current amplification

Electronics tester with double-spiral thermal control passage in a thermal chuck

Apparatus for testing electronic devices

Electronics tester with group and individual current configurations

Electronics tester with hot fluid thermal control

Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion

RICHMOND II DONALD P

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

Apparatus for testing electronic devices

CHIPSCALE INC

Semiconductor fabrication with contact processing for wrap-around flange interface

Method for making a leadless surface mounted device with wrap-around flange interface contacts

LINDSEY SCOTT E

System for testing an integrated circuit of a device and its method of use

System for testing an integrated circuit of a device and its method of use

STEPS STEVEN C

Adhesively attached stand-offs on a portable pack for an electronics tester

Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion

AEHR Test Ststems

System for testing an integrated circuit of a device and its method of use

LAM RES CORP

Modular control system for manufacturing facility

HENDRICKSON DAVID S

Integrated feedthrough module