Inventor
HENDRICKSON DAVID S
US16 patents
⚠️ This page may combine multiple inventors who share the name “HENDRICKSON DAVID S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AEHR TEST SYSTEMS
12 patentsUS7969175B2Jun 28, 2011
Separate test electronics and blower modules in an apparatus for testing an integrated circuit
AEHR TEST SYSTEMS27 citations91
US6815966B1Nov 9, 2004
System for burn-in testing of electronic devices
AEHR TEST SYSTEMS24 citations90
US11448695B2Sep 20, 2022
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS3 citations84
USD850309SJun 4, 2019
Layout of contacts
AEHR TEST SYSTEMS4 citations73
US7063544B2Jun 20, 2006
System for burn-in testing of electronic devices
AEHR TEST SYSTEMS7 citations71
USD629760SDec 28, 2010
Interface on an electronics connector
AEHR TEST SYSTEMS3 citations63
US12326472B2Jun 10, 2025
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS0 citations62
US10677843B2Jun 9, 2020
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS0 citations52
USD875579SFeb 18, 2020
Layout of contacts
AEHR TEST SYSTEMS0 citations52
US10488437B2Nov 26, 2019
Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode
AEHR TEST SYSTEMS0 citations52
US9874583B2Jan 23, 2018
Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode
AEHR TEST SYSTEMS0 citations52
USD630166SJan 4, 2011
Connector
AEHR TEST SYSTEMS0 citations52