P

Inventor

HIRAE SADAO

JP19 patents

Patents

19 patents
US6729561B2May 4, 2004

Cleaning nozzle and substrate cleaning apparatus

DAINIPPON SCREEN MFG93 citations98
US7479205B2Jan 20, 2009

Substrate processing apparatus

DAINIPPON SCREEN MFG23 citations92
US6951221B2Oct 4, 2005

Substrate processing apparatus

DAINIPPON SCREEN MFG22 citations92
US6901938B2Jun 7, 2005

Substrate cleaning apparatus

DAINIPPON SCREEN MFG27 citations92
US6705331B2Mar 16, 2004

Substrate cleaning apparatus

DAINIPPON SCREEN MFG29 citations92
US6598805B2Jul 29, 2003

Substrate cleaning apparatus

DAINIPPON SCREEN MFG33 citations92
US5857474AJan 12, 1999

Method of and apparatus for washing a substrate

DAINIPPON SCREEN MFG45 citations92
US5314831AMay 24, 1994

Method of and apparatus for evaluating crystal rate in silicon thin film

DAINIPPON SCREEN MFG35 citations92
US5568252AOct 22, 1996

Method and apparatus for measuring insulation film thickness of semiconductor wafer

DAINIPPON SCREEN MFG30 citations91
US5475319ADec 12, 1995

Method of measuring electric charge of semiconductor wafer

DAINIPPON SCREEN MFG20 citations91
US5239183AAug 24, 1993

Optical gap measuring device using frustrated internal reflection

DAINIPPON SCREEN MFG28 citations91
US5225690AJul 6, 1993

Gap measuring device and method using frustrated internal reflection

DAINIPPON SCREEN MFG25 citations91
US7267130B2Sep 11, 2007

Substrate processing apparatus

DAINIPPON SCREEN MFG7 citations73
US5554939ASep 10, 1996

Non-destructive measuring sensor for semiconductor wafer and method of manufacturing the same

DAINIPPON SCREEN MFG14 citations73
US5444389AAug 22, 1995

Method and apparatus for measuring lifetime of minority carriers in semiconductor

DAINIPPON SCREEN MFG9 citations73
US7600522B2Oct 13, 2009

Substrate treatment method and substrate treatment apparatus

DAINIPPON SCREEN MFG2 citations63
US6278267B1Aug 21, 2001

Method of determining impurity content and apparatus for the same

DAINIPPON SCREEN MFG3 citations62
US5504437AApr 2, 1996

Apparatus and method for electrical measurement of semiconductor wafers

DAINIPPON SCREEN MFG2 citations62
US7428907B2Sep 30, 2008

Substrate processing apparatus

DAINIPPON SCREEN MFG1 citations51