Inventor
NIIJIMA HIROKATSU
JP10 patents
Patents
10 patentsUS7447955B2Nov 4, 2008
Test apparatus and test method
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US7002334B2Feb 21, 2006
Jitter measuring apparatus and a testing apparatus
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US7197682B2Mar 27, 2007
Semiconductor test device and timing measurement method
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US7100099B2Aug 29, 2006
Test apparatus
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US6768954B2Jul 27, 2004
Jitter quantity calculator and tester
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US5955907ASep 21, 1999
Temperature compensation circuit and method for providing a constant delay
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US5732047AMar 24, 1998
Timing comparator circuit for use in device testing apparatus
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US7409615B2Aug 5, 2008
Test apparatus and test method
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US7262627B2Aug 28, 2007
Measuring apparatus, measuring method, and test apparatus
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US8014969B2Sep 6, 2011
Test apparatus, test method and manufacturing method
ADVANTEST CORP0 citations36