Inventor
SUMI YUKINORI
JP5 patents
Patents
5 patentsUS6333638B1Dec 25, 2001
Semiconductor test apparatus and test method using the same
FUJITSU LTD29 citations91
US6246249B1Jun 12, 2001
Semiconductor inspection apparatus and inspection method using the apparatus
FUJITSU LTD38 citations91
US5767528AJun 16, 1998
Semiconductor device including pad portion for testing
FUJITSU LTD46 citations91
US6518784B2Feb 11, 2003
Test method using semiconductor test apparatus
FUJITSU LTD6 citations72
US6388461B2May 14, 2002
Semiconductor inspection apparatus and inspection method using the apparatus
FUJITSU LTD2 citations61