Inventor
KOIKE HIROTAMI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “KOIKE HIROTAMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
11 patentsUS7329867B2Feb 12, 2008
Electron beam system and electron beam measuring and observing methods
TOPCON CORP20 citations92
US7151258B2Dec 19, 2006
Electron beam system and electron beam measuring and observing methods
TOPCON CORP22 citations92
US6852974B2Feb 8, 2005
Electron beam device and method for stereoscopic measurements
TOPCON CORP40 citations92
US6642520B2Nov 4, 2003
Scanning electron microscope
TOPCON CORP21 citations92
US6201241B1Mar 13, 2001
Organic substance analyzer
TOPCON CORP26 citations92
US6717144B2Apr 6, 2004
Scanning electron microscope system
TOPCON CORP8 citations73
US5393976AFeb 28, 1995
Apparatus for displaying a sample image
TOPCON CORP19 citations73
US7902504B2Mar 8, 2011
Charged particle beam reflector device and electron microscope
TOPCON CORP3 citations62
US7592604B2Sep 22, 2009
Charged particle beam apparatus
TOPCON CORP4 citations62
US5382796AJan 17, 1995
Apparatus for morphological observation of a sample
TOPCON CORP6 citations62
US6894277B2May 17, 2005
Scanning electron microscope
TOPCON CORP1 citations51