Inventor
INADA YOSHIKAZU
JP6 patents
⚠️ This page may combine multiple inventors who share the name “INADA YOSHIKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
4 patentsUS7297945B2Nov 20, 2007
Defective product inspection apparatus, probe positioning method and probe moving method
HITACHI HIGH TECH CORP18 citations92
US7553334B2Jun 30, 2009
Defective product inspection apparatus, probe positioning method and probe moving method
HITACHI HIGH TECH CORP9 citations84
US7129727B2Oct 31, 2006
Defect inspecting apparatus
HITACHI HIGH TECH CORP13 citations82
US7271385B2Sep 18, 2007
Inspection method and inspection apparatus using electron beam
HITACHI HIGH TECH CORP5 citations59