Inventor

LIAN JINGYU

US27 patents

⚠️ This page may combine multiple inventors who share the name “LIAN JINGYU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIAN JINGYU

INFINEON TECHNOLOGIES AG

Piezoelectric stress liner for bulk and SOI

Methods for crystallizing metallic oxide dielectric films at low temperature

Semiconductor devices having pFET with SiGe gate electrode and embedded SiGe source/drain regions and methods of making the same

Multi-layer Pt electrode for DRAM and FRAM with high K dielectric materials

Recess Pt structure for high k stacked capacitor in DRAM and FRAM, and the method to form this structure

Semiconductor devices and methods of manufacturing thereof

Metrology systems and methods for lithography processes

Feature dimension control in a manufacturing process

Multi-layer electrode and method of forming the same

Multi-layer barrier allowing recovery anneal for ferroelectric capacitors

Method for fabricating a semiconductor gate structure

Avoiding shorting in capacitors

Semiconductor devices and methods of manufacturing thereof

Method for manufacturing a semiconductor device having doped and undoped polysilicon layers

Self-aligned V0-contact for cell size reduction

Self-aligned V0-contact for cell size reduction

Device and method for inhibiting oxidation of contact plugs in ferroelectric capacitor devices

IBM

Adhesion layer for Pt on SiO2

Automatic generation of ground rule verification macros

TOSHIBA KK

Sidewall structure and method of fabrication for reducing oxygen diffusion to contact plugs during CW hole reactive ion etch processing

Method of fabrication of an FeRAM capacitor and an FeRAM capacitor formed by the method

ZHUANG HAOREN

Semiconductor device manufacturing methods

Semiconductor device having a polysilicon layer with a non-constant doping profile

HAN JIN-PING

Semiconductor device and method of making same

Semiconductor devices having pFET with SiGe gate electrode and embedded SiGe source/drain regions and methods of making the same

SARMA CHANDRASEKHAR

Metrology systems and methods for lithography processes

Metrology systems and methods for lithography processes