Inventor

FURUKAWA YASUO

JP51 patents

⚠️ This page may combine multiple inventors who share the name “FURUKAWA YASUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FURUKAWA YASUO

ADVANTEST CORP

Low-distortion waveform generating method and waveform generator using the same

Jitter measuring device and method

Test device and method for electrically testing electronic device

Apparatus for and method of measuring a jitter

Testing apparatus, and testing method

Waveform generator, semiconductor testing device and semiconductor device

Carrier module for adapting non-standard instrument cards to test systems

Carrier module for adapting non-standard instrument cards to test systems

Device and method for electronic device test

Test apparatus and test method

Method and apparatus for testing a semiconductor device

Wireless power receiver

Wireless power transmitter

Wireless power transmitter and wireless power receiver

LSI testing apparatus for testing an electronic device

Impedance measurement apparatus

Test apparatus and test method

Test apparatus and test method

Test apparatus, test method, electronic device, and electronic device manufacturing method

Waveform generator and testing device

Test apparatus, test vector generate unit, test method, program, and recording medium

Wireless power receiving apparatus

Wireless power transmitter and wireless power receiver

Measurement apparatus, test system, and measurement method for measuring a characteristic of a device

Test apparatus and test method for testing a device based on quiescent current

Method and apparatus for testing circuit using light emission

LSI testing apparatus for testing an electronic device

LSI testing apparatus

Wireless power receiver

Relay device of wireless power transmission system

Wireless power transmitting apparatus and wireless power supply system

Wireless power receiving apparatus

Wireless power transmitter and wireless power receiver

FUJITSU LTD

Rotary anode assembly for an X-ray source

Laser light source device

Back-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electrons

Exposure system and method using an electron beam

FURUKAWA YASUO

Wireless power supply apparatus

Wireless power receiving apparatus and wireless power supply system

Test apparatus, test method, program, and recording medium reducing the influence of variations

HIRAKAWA HEWTECH CORP

Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses

Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses

TOHO RAYON KK

Low fuming phenolic resin prepreg and process for producing the same

KOKUSAI DENSHIN DENWA CO LTD

Audio frequency signal identification apparatus

SHINETSU CHEMICAL CO

Method for preventing polymer scale deposition in the polymerization of a vinylic monomer

TAKEDA RIKEN IND CO LTD

DA Converter

ENDO YUKI

Wireless power receiving apparatus

HORIBA LTD

Radiation thermometer, temperature measurement method, and temperature measurement program

ASAMI KOJI

Test apparatus and test method for A/D converter

KOJIMA SHOJI

IDDQ test apparatus and test method