Inventor

NOLET ALAN

US5 patents

⚠️ This page may combine multiple inventors who share the name “NOLET ALAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TIMBRE TECH INC

2 patents

US7444196B2Oct 28, 2008

Optimized characterization of wafers structures for optical metrology

TIMBRE TECH INC10 citations82

US7515282B2Apr 7, 2009

Modeling and measuring structures with spatially varying properties in optical metrology

TIMBRE TECH INC5 citations62

SAMTEC INC

2 patents

US12476117B2Nov 18, 2025

Electrically conductive vias and methods for producing same

SAMTEC INC0 citations57

US12009225B2Jun 11, 2024

Electrically conductive vias and methods for producing same

SAMTEC INC0 citations57

TOKYO ELECTRON LTD

1 patent

US7566181B2Jul 28, 2009

Controlling critical dimensions of structures formed on a wafer in semiconductor processing

TOKYO ELECTRON LTD7 citations71