Inventor

WU KENONG

US33 patents

⚠️ This page may combine multiple inventors who share the name “WU KENONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WU KENONG

KLA TENCOR CORP

Detecting defects on a wafer using defect-specific and multi-channel information

Detecting defects on a wafer using defect-specific and multi-channel information

Defect detection and classification based on attributes determined from a standard reference image

Wafer inspection using free-form care areas

High accuracy of relative defect locations for repeater analysis

Detecting defects on a wafer using defect-specific information

Wafer defect discovery

System and method for aligning semiconductor device reference images and test images

Array mode repeater detection

Detecting defects on a wafer using defect-specific and multi-channel information

Adaptive local threshold and color filtering

Defect detection using structural information

Adaptive local threshold and color filtering

Repeater detection

High accuracy of relative defect locations for repeater analysis

System, method and non-transitory computer readable medium for tuning sensitivities of, and determining a process window for, a modulated wafer

Detecting defects on a wafer using defect-specific information

System, method and non-transitory computer readable medium for tuning sensitivies of, and determining a process window for, a modulated wafer

System and method for defining care areas in repeating structures of design data

Methods to store dynamic layer content inside a design file

KLA TENCOR TECH CORP

Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle

Methods and systems for binning defects detected on a specimen

Automatic supervised classifier setup tool for semiconductor defects

Flexible hybrid defect classification for semiconductor manufacturing

KLA CORP

Detecting defects in a logic region on a wafer

Print check repeater defect detection

Print check repeater defect detection

WU KENONG

Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle

Selecting parameters for defect detection methods

IBM

System and method for fusing three-dimensional shape data on distorted images without correcting for distortion

LEE CHRIS

Selecting one or more parameters for inspection of a wafer

GAO LISHENG

Region based virtual fourier filter

THATTAISUNDARAM GOVIND

Data perturbation for wafer inspection or metrology setup using a model of a difference