Inventor
LIANG FAGUO
CN5 patents
Patents
5 patentsUS11971451B2Apr 30, 2024
Method for determining parameters in on-wafer calibration piece model
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations47
US11733298B2Aug 22, 2023
Two-port on-wafer calibration piece circuit model and method for determining parameters
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations47
US11385175B2Jul 12, 2022
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations47
US11340286B2May 24, 2022
On-wafer S-parameter calibration method
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations45
US11275103B2Mar 15, 2022
Calibration method, system and device of on-wafer s parameter of vector network analyzer
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION0 citations43