Inventor
HAYASHI SHINGO
JP25 patents
⚠️ This page may combine multiple inventors who share the name “HAYASHI SHINGO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMRON TATEISI ELECTRONICS CO
6 patentsUS11936985B2Mar 19, 2024
Appearance inspection device and defect inspection method
OMRON TATEISI ELECTRONICS CO2 citations72
US12379325B2Aug 5, 2025
External appearance inspection apparatus and external appearance inspection method
OMRON TATEISI ELECTRONICS CO0 citations62
US10805552B2Oct 13, 2020
Visual inspection device and illumination condition setting method of visual inspection device
OMRON TATEISI ELECTRONICS CO1 citations62
US11709050B2Jul 25, 2023
Position measurement method using a calibration plate to correct a detection value from the position detector
OMRON TATEISI ELECTRONICS CO0 citations47
US12072180B2Aug 27, 2024
Measurement method for amount of deviation, and measurement apparatus
OMRON TATEISI ELECTRONICS CO0 citations41
US11333535B2May 17, 2022
Method for correcting values detected by linear scales
OMRON TATEISI ELECTRONICS CO0 citations41
FUJI ELECTRIC CO LTD
5 patentsUS12507452B2Dec 23, 2025
Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US12349451B2Jul 1, 2025
Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US12132083B2Oct 29, 2024
Silicon carbide semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US11742392B2Aug 29, 2023
Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device
FUJI ELECTRIC CO LTD0 citations50
US11721756B2Aug 8, 2023
Semiconductor device
FUJI ELECTRIC CO LTD0 citations46