Inventor
MIYAZAWA MAKOTO
JP20 patents
⚠️ This page may combine multiple inventors who share the name “MIYAZAWA MAKOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO EPSON CORP
12 patentsUS6743486B1Jun 1, 2004
Method for producing spectacle lens and lens processing system
SEIKO EPSON CORP43 citations92
US6872120B2Mar 29, 2005
Method of producing spectacle lens
SEIKO EPSON CORP17 citations80
US7070474B2Jul 4, 2006
Aspheric-surface processing method and aspheric-surface forming method
SEIKO EPSON CORP8 citations73
US6945849B2Sep 20, 2005
Polishing method and polishing device
SEIKO EPSON CORP10 citations73
US12459250B2Nov 4, 2025
Liquid ejection apparatus and head unit
SEIKO EPSON CORP0 citations62
US7448942B2Nov 11, 2008
Grinding method
SEIKO EPSON CORP5 citations62
US7207863B2Apr 24, 2007
Aspheric-surface processing method and aspheric-surface forming method
SEIKO EPSON CORP2 citations62
US7077729B2Jul 18, 2006
Aspherical surface processing method, aspherical surface forming method and aspherical surface processing apparatus
SEIKO EPSON CORP2 citations62
US6929534B2Aug 16, 2005
Polisher and polishing method
SEIKO EPSON CORP5 citations62
US7074119B2Jul 11, 2006
Polishing jig, conveyor tray, conveying method and conveying device
SEIKO EPSON CORP5 citations59
US12459256B2Nov 4, 2025
Liquid discharge apparatus
SEIKO EPSON CORP0 citations51
US9126418B2Sep 8, 2015
Printing apparatus
SEIKO EPSON CORP0 citations41
NIPPON KOKAN KK
4 patentsUS3932585AJan 13, 1976
Method of removing nitrogen oxides from plant exhaust
NIPPON KOKAN KK14 citations73
US4025604AMay 24, 1977
Method of removing nitrogen oxides from exhaust gas by reduction
NIPPON KOKAN KK10 citations69
US5306842AApr 26, 1994
Method of manufacturing aromatic urethanes
NIPPON KOKAN KK1 citations51
US5130464AJul 14, 1992
Method of manufacturing aromatic urethanes
NIPPON KOKAN KK0 citations48
NEC CORP
2 patentsUS4733285AMar 22, 1988
Semiconductor device with input and/or output protective circuit
NEC CORP16 citations72
US5812354ASep 22, 1998
Semiconductor integrated circuit device having substrate potential detecting circuit less damaged by static charge propagated thereto through shared conductive line
NEC CORP1 citations51