Inventor
HUANG TENG-YEN
TW15 patents
Patents
15 patentsUS6998205B2Feb 14, 2006
Optical proximity correction method
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US11038060B2Jun 15, 2021
Semiconductor device with embedded sigma-shaped structure and method for preparing the same
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US7919216B2Apr 5, 2011
Mask and design method thereof
NANYA TECHNOLOGY CORP2 citations61
US12255161B2Mar 18, 2025
Semiconductor device with composite conductive features and method for fabricating the same
NANYA TECHNOLOGY CORP0 citations60
US12218087B2Feb 4, 2025
Semiconductor device with composite conductive features and method for fabricating the same
NANYA TECHNOLOGY CORP0 citations60
US12002772B2Jun 4, 2024
Semiconductor device with composite conductive features and method for fabricating the same
NANYA TECHNOLOGY CORP0 citations60
US11824004B2Nov 21, 2023
Method for fabricating semiconductor device structure with manganese-containing conductive plug
NANYA TECHNOLOGY CORP0 citations60
US11810977B2Nov 7, 2023
Semiconductor device with embedded sigma-shaped structure
NANYA TECHNOLOGY CORP0 citations60
US11581267B2Feb 14, 2023
Method for fabricating semiconductor device with protection structure and air gaps
NANYA TECHNOLOGY CORP0 citations60
US11488905B2Nov 1, 2022
Semiconductor device structure with manganese-containing conductive plug and method for forming the same
NANYA TECHNOLOGY CORP0 citations60
US11164823B2Nov 2, 2021
Semiconductor device with crack-detecting structure and method for fabricating the same
NANYA TECHNOLOGY CORP0 citations60
US11152311B1Oct 19, 2021
Semiconductor device with protection structure and air gaps and method for fabricating the same
NANYA TECHNOLOGY CORP0 citations60
US6929902B2Aug 16, 2005
Method of preventing repeated collapse in a reworked photoresist layer
NANYA TECHNOLOGY CORP0 citations51
US10636911B1Apr 28, 2020
Fin structure and method for manufacturing the same
NANYA TECHNOLOGY CORP0 citations50
US7090965B2Aug 15, 2006
Method for enhancing adhesion between reworked photoresist and underlying oxynitride film
NANYA TECHNOLOGY CORP0 citations46