P

Inventor

HUANG TENG-YEN

TW15 patents

Patents

15 patents
US6998205B2Feb 14, 2006

Optical proximity correction method

NANYA TECHNOLOGY CORP16 citations82
US11038060B2Jun 15, 2021

Semiconductor device with embedded sigma-shaped structure and method for preparing the same

NANYA TECHNOLOGY CORP4 citations71
US7919216B2Apr 5, 2011

Mask and design method thereof

NANYA TECHNOLOGY CORP2 citations61
US12255161B2Mar 18, 2025

Semiconductor device with composite conductive features and method for fabricating the same

NANYA TECHNOLOGY CORP0 citations60
US12218087B2Feb 4, 2025

Semiconductor device with composite conductive features and method for fabricating the same

NANYA TECHNOLOGY CORP0 citations60
US12002772B2Jun 4, 2024

Semiconductor device with composite conductive features and method for fabricating the same

NANYA TECHNOLOGY CORP0 citations60
US11824004B2Nov 21, 2023

Method for fabricating semiconductor device structure with manganese-containing conductive plug

NANYA TECHNOLOGY CORP0 citations60
US11810977B2Nov 7, 2023

Semiconductor device with embedded sigma-shaped structure

NANYA TECHNOLOGY CORP0 citations60
US11581267B2Feb 14, 2023

Method for fabricating semiconductor device with protection structure and air gaps

NANYA TECHNOLOGY CORP0 citations60
US11488905B2Nov 1, 2022

Semiconductor device structure with manganese-containing conductive plug and method for forming the same

NANYA TECHNOLOGY CORP0 citations60
US11164823B2Nov 2, 2021

Semiconductor device with crack-detecting structure and method for fabricating the same

NANYA TECHNOLOGY CORP0 citations60
US11152311B1Oct 19, 2021

Semiconductor device with protection structure and air gaps and method for fabricating the same

NANYA TECHNOLOGY CORP0 citations60
US6929902B2Aug 16, 2005

Method of preventing repeated collapse in a reworked photoresist layer

NANYA TECHNOLOGY CORP0 citations51
US10636911B1Apr 28, 2020

Fin structure and method for manufacturing the same

NANYA TECHNOLOGY CORP0 citations50
US7090965B2Aug 15, 2006

Method for enhancing adhesion between reworked photoresist and underlying oxynitride film

NANYA TECHNOLOGY CORP0 citations46