Inventor

HAO YUDONG

US4 patents

⚠️ This page may combine multiple inventors who share the name “HAO YUDONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

2 patents

US12489005B2Dec 2, 2025

Temperature-based metrology calibration at a manufacturing system

APPLIED MATERIALS INC0 citations57

US12386342B2Aug 12, 2025

Holistic analysis of multidimensional sensor data for substrate processing equipment

APPLIED MATERIALS INC0 citations50

NANOMETRICS INC

1 patent

US7450225B1Nov 11, 2008

Correction of optical metrology for focus offset

NANOMETRICS INC11 citations81

LIU ZHUAN

1 patent

US8126694B2Feb 28, 2012

Modeling conductive patterns using an effective model

LIU ZHUAN4 citations57