Inventor
FUKUSHIMA SHINYA
JP18 patents
⚠️ This page may combine multiple inventors who share the name “FUKUSHIMA SHINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SUMCO CORP
5 patentsUS10871515B2Dec 22, 2020
Method of measuring Fe concentration in p-type silicon wafer
SUMCO CORP2 citations72
US12107018B2Oct 1, 2024
Method of measuring concentration of Fe in p-type silicon wafer and SPV measurement apparatus
SUMCO CORP0 citations58
US11387151B2Jul 12, 2022
Method of measuring concentration of Fe in p-type silicon wafer and SPV measurement apparatus
SUMCO CORP0 citations58
US9935020B2Apr 3, 2018
Method of evaluating metal contamination in boron-doped P-type silicon wafer, device of evaluating metal contamination in boron-doped P-type silicon wafer, and method of manufacturing boron-doped P-type silicon wafer
SUMCO CORP0 citations52
US9080814B2Jul 14, 2015
Continuous casting method of silicon ingot
SUMCO CORP0 citations50