P

Inventor

SHEU SHING-REN

TW21 patents

Patents

21 patents
US6455943B1Sep 24, 2002

Bonding pad structure of semiconductor device having improved bondability

UNITED MICROELECTRONICS CORP51 citations95
US7859285B2Dec 28, 2010

Device under test array for identifying defects

UNITED MICROELECTRONICS CORP22 citations92
US6417548B1Jul 9, 2002

Variable work function transistor high density mask ROM

UNITED MICROELECTRONICS CORP26 citations92
US6054353AApr 25, 2000

Short turn around time mask ROM process

UNITED MICROELECTRONICS CORP27 citations92
US5691234ANov 25, 1997

Buried contact method to release plasma-induced charging damage on device

UNITED MICROELECTRONICS CORP23 citations92
US5576573ANov 19, 1996

Stacked CVD oxide architecture multi-state memory cell for mask read-only memories

UNITED MICROELECTRONICS CORP36 citations92
US5571737ANov 5, 1996

Metal oxide semiconductor device integral with an electro-static discharge circuit

UNITED MICROELECTRONICS CORP22 citations92
US5429975AJul 4, 1995

Method of implanting during manufacture of ROM device

UNITED MICROELECTRONICS CORP25 citations92
US5382534AJan 17, 1995

Field effect transistor with recessed buried source and drain regions

UNITED MICROELECTRONICS CORP28 citations92
US7026234B2Apr 11, 2006

Parasitic capacitance-preventing dummy solder bump structure and method of making the same

UNITED MICROELECTRONICS CORP14 citations83
US6093626AJul 25, 2000

Buried contact method to release plasma-included charging damage on device

UNITED MICROELECTRONICS CORP14 citations74
US5597753AJan 28, 1997

CVD oxide coding method for ultra-high density mask read-only-memory (ROM)

UNITED MICROELECTRONICS CORP17 citations74
US6350654B1Feb 26, 2002

Semiconductor read-only memory device and method of fabricating the same

UNITED MICROELECTRONICS CORP6 citations73
US5942786AAug 24, 1999

Variable work function transistor high density mask ROM

UNITED MICROELECTRONICS CORP9 citations73
US5488009AJan 30, 1996

Post-titanium nitride mask ROM programming method

UNITED MICROELECTRONICS CORP6 citations71
US6146950ANov 14, 2000

Method of manufacturing multiple metallic layered embedded ROM

UNITED MICROELECTRONICS CORP11 citations68
US5998832ADec 7, 1999

Metal oxide semiconductor device for an electro-static discharge circuit

UNITED MICROELECTRONICS CORP5 citations63
US5654576AAug 5, 1997

Post-titanium nitride mask ROM programming method and device manufactured thereby

UNITED MICROELECTRONICS CORP4 citations63
US5589411ADec 31, 1996

Process for fabricating a high-voltage MOSFET

UNITED MICROELECTRONICS CORP3 citations63
US5567970AOct 22, 1996

Post metal mask ROM with thin glass dielectric layer formed over word lines

UNITED MICROELECTRONICS CORP5 citations63
US6380587B1Apr 30, 2002

Semiconductor read-only memory device and method of fabricating the same

UNITED MICROELECTRONICS CORP0 citations52