Inventor
PUZZILLI GIUSEPPINA
US37 patents
⚠️ This page may combine multiple inventors who share the name “PUZZILLI GIUSEPPINA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
32 patentsUS8767467B2Jul 1, 2014
In-field block retiring
MICRON TECHNOLOGY INC8 citations82
US11385819B2Jul 12, 2022
Separate partition for buffer and snapshot memory
MICRON TECHNOLOGY INC2 citations73
US11360700B2Jun 14, 2022
Partitions within snapshot memory for buffer and snapshot memory
MICRON TECHNOLOGY INC2 citations73
US11288160B2Mar 29, 2022
Threshold voltage distribution adjustment for buffer
MICRON TECHNOLOGY INC4 citations73
US11709616B2Jul 25, 2023
Adjusting a preprogram voltage based on use of a memory device
MICRON TECHNOLOGY INC2 citations71
US11461035B2Oct 4, 2022
Adjusting a preprogram voltage based on use of a memory device
MICRON TECHNOLOGY INC4 citations71
US11443812B2Sep 13, 2022
Setting an initial erase voltage using feedback from previous operations
MICRON TECHNOLOGY INC2 citations71
US8369158B2Feb 5, 2013
Erase operations and apparatus for a memory device
MICRON TECHNOLOGY INC2 citations63
US12498877B2Dec 16, 2025
Mitigating slow read disturb in a memory sub-system
MICRON TECHNOLOGY INC0 citations62
US11941285B2Mar 26, 2024
Mitigating slow read disturb in a memory sub-system
MICRON TECHNOLOGY INC0 citations62
US11899966B2Feb 13, 2024
Implementing fault tolerant page stripes on low density memory systems
MICRON TECHNOLOGY INC0 citations62
US11847335B2Dec 19, 2023
Latent read disturb mitigation in memory devices
MICRON TECHNOLOGY INC0 citations62
US11797216B2Oct 24, 2023
Read calibration based on ranges of program/erase cycles
MICRON TECHNOLOGY INC0 citations62
US11789629B2Oct 17, 2023
Separate partition for buffer and snapshot memory
MICRON TECHNOLOGY INC0 citations62
US11775208B2Oct 3, 2023
Partitions within snapshot memory for buffer and snapshot memory
MICRON TECHNOLOGY INC0 citations62
US11694763B2Jul 4, 2023
Read voltage calibration for copyback operation
MICRON TECHNOLOGY INC0 citations62
US11688479B2Jun 27, 2023
Read window based on program/erase cycles
MICRON TECHNOLOGY INC0 citations62
US11663104B2May 30, 2023
Threshold voltage distribution adjustment for buffer
MICRON TECHNOLOGY INC0 citations62
US11487436B2Nov 1, 2022
Trims corresponding to logical unit quantity
MICRON TECHNOLOGY INC0 citations62
US11481273B2Oct 25, 2022
Partitioned memory having error detection capability
MICRON TECHNOLOGY INC0 citations62
US11449271B2Sep 20, 2022
Implementing fault tolerant page stripes on low density memory systems
MICRON TECHNOLOGY INC0 citations62
US11437111B2Sep 6, 2022
Trims corresponding to program/erase cycles
MICRON TECHNOLOGY INC0 citations62
US11392312B2Jul 19, 2022
Read calibration based on ranges of program/erase cycles
MICRON TECHNOLOGY INC0 citations62
US11309052B2Apr 19, 2022
Read voltage calibration for copyback operation
MICRON TECHNOLOGY INC0 citations62
US11301346B2Apr 12, 2022
Separate trims for buffer and snapshot
MICRON TECHNOLOGY INC1 citations62
US11189355B1Nov 30, 2021
Read window based on program/erase cycles
MICRON TECHNOLOGY INC0 citations62
US11468949B2Oct 11, 2022
Temperature-dependent operations in a memory device
MICRON TECHNOLOGY INC0 citations61
US11776629B2Oct 3, 2023
Threshold voltage based on program/erase cycles
MICRON TECHNOLOGY INC0 citations52
US11762767B2Sep 19, 2023
Storing highly read data at low impact read disturb pages of a memory device
MICRON TECHNOLOGY INC0 citations52
US11556267B2Jan 17, 2023
Data management during a copyback operation
MICRON TECHNOLOGY INC0 citations52
US11430528B2Aug 30, 2022
Determining a read voltage based on a change in a read window
MICRON TECHNOLOGY INC0 citations52
US9490025B2Nov 8, 2016
Methods of programming memory devices
MICRON TECHNOLOGY INC0 citations52