P

Inventor

PUZZILLI GIUSEPPINA

US37 patents
⚠️ This page may combine multiple inventors who share the name “PUZZILLI GIUSEPPINA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

32 patents
US8767467B2Jul 1, 2014

In-field block retiring

MICRON TECHNOLOGY INC8 citations82
US11385819B2Jul 12, 2022

Separate partition for buffer and snapshot memory

MICRON TECHNOLOGY INC2 citations73
US11360700B2Jun 14, 2022

Partitions within snapshot memory for buffer and snapshot memory

MICRON TECHNOLOGY INC2 citations73
US11288160B2Mar 29, 2022

Threshold voltage distribution adjustment for buffer

MICRON TECHNOLOGY INC4 citations73
US11709616B2Jul 25, 2023

Adjusting a preprogram voltage based on use of a memory device

MICRON TECHNOLOGY INC2 citations71
US11461035B2Oct 4, 2022

Adjusting a preprogram voltage based on use of a memory device

MICRON TECHNOLOGY INC4 citations71
US11443812B2Sep 13, 2022

Setting an initial erase voltage using feedback from previous operations

MICRON TECHNOLOGY INC2 citations71
US8369158B2Feb 5, 2013

Erase operations and apparatus for a memory device

MICRON TECHNOLOGY INC2 citations63
US12498877B2Dec 16, 2025

Mitigating slow read disturb in a memory sub-system

MICRON TECHNOLOGY INC0 citations62
US11941285B2Mar 26, 2024

Mitigating slow read disturb in a memory sub-system

MICRON TECHNOLOGY INC0 citations62
US11899966B2Feb 13, 2024

Implementing fault tolerant page stripes on low density memory systems

MICRON TECHNOLOGY INC0 citations62
US11847335B2Dec 19, 2023

Latent read disturb mitigation in memory devices

MICRON TECHNOLOGY INC0 citations62
US11797216B2Oct 24, 2023

Read calibration based on ranges of program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11789629B2Oct 17, 2023

Separate partition for buffer and snapshot memory

MICRON TECHNOLOGY INC0 citations62
US11775208B2Oct 3, 2023

Partitions within snapshot memory for buffer and snapshot memory

MICRON TECHNOLOGY INC0 citations62
US11694763B2Jul 4, 2023

Read voltage calibration for copyback operation

MICRON TECHNOLOGY INC0 citations62
US11688479B2Jun 27, 2023

Read window based on program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11663104B2May 30, 2023

Threshold voltage distribution adjustment for buffer

MICRON TECHNOLOGY INC0 citations62
US11487436B2Nov 1, 2022

Trims corresponding to logical unit quantity

MICRON TECHNOLOGY INC0 citations62
US11481273B2Oct 25, 2022

Partitioned memory having error detection capability

MICRON TECHNOLOGY INC0 citations62
US11449271B2Sep 20, 2022

Implementing fault tolerant page stripes on low density memory systems

MICRON TECHNOLOGY INC0 citations62
US11437111B2Sep 6, 2022

Trims corresponding to program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11392312B2Jul 19, 2022

Read calibration based on ranges of program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11309052B2Apr 19, 2022

Read voltage calibration for copyback operation

MICRON TECHNOLOGY INC0 citations62
US11301346B2Apr 12, 2022

Separate trims for buffer and snapshot

MICRON TECHNOLOGY INC1 citations62
US11189355B1Nov 30, 2021

Read window based on program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11468949B2Oct 11, 2022

Temperature-dependent operations in a memory device

MICRON TECHNOLOGY INC0 citations61
US11776629B2Oct 3, 2023

Threshold voltage based on program/erase cycles

MICRON TECHNOLOGY INC0 citations52
US11762767B2Sep 19, 2023

Storing highly read data at low impact read disturb pages of a memory device

MICRON TECHNOLOGY INC0 citations52
US11556267B2Jan 17, 2023

Data management during a copyback operation

MICRON TECHNOLOGY INC0 citations52
US11430528B2Aug 30, 2022

Determining a read voltage based on a change in a read window

MICRON TECHNOLOGY INC0 citations52
US9490025B2Nov 8, 2016

Methods of programming memory devices

MICRON TECHNOLOGY INC0 citations52

INTEL CORP

1 patent

GODA AKIRA

1 patent

PUZZILLI GIUSEPPINA

1 patent

PARAT KRISHNA K

1 patent

LODESTAR LICENSING GROUP LLC

1 patent